Skip to main content
Erschienen in: Journal of Materials Science: Materials in Electronics 4/2015

01.04.2015

Investigation of copper plated-through-holes in glass fiber reinforced epoxy substrates using AC impedance spectroscopy

verfasst von: Koushik Ramachandran, Timothy L. Pruyn, Timothy Huang, Yushu Wang, Preet M. Singh, W. Jud Ready, Rosario A. Gerhardt, Venky Sundaram, Rao Tummala

Erschienen in: Journal of Materials Science: Materials in Electronics | Ausgabe 4/2015

Einloggen

Aktivieren Sie unsere intelligente Suche, um passende Fachinhalte oder Patente zu finden.

search-config
loading …

Abstract

AC impedance spectroscopy was used to investigate copper plated-through-holes (PTH) in glass fiber reinforced epoxy substrates (FR4) at different stages of temperature-humidity-bias driven electrochemical migration failure. The test vehicles consisted of PTHs arranged in an alternate anode and cathode configuration in FR4 boards. The test vehicles were subjected to accelerated stress testing [130 °C, 85 % relative humidity (RH) and 100 V DC] to initiate a specific sub-surface electrochemical failure mode referred to as conductive anodic filament (CAF) formation. The test vehicle variations included a control with no exposure, test vehicle with electrical insulation failure (resistance change to 1 MΩ during the test) and test vehicle with initiation of CAF to compare the impedance characteristics at different stages of electrochemical migration failure. AC impedance measurements were carried out on the test vehicle variations at ambient and in an in situ humidity chamber as a function of RH at 14–85 %. The prior exposure condition of the test vehicles was found to have a strong effect on the impedance characteristics at different RH values. The accelerated testing results and impedance characteristics of the PTHs in epoxy-glass fiber substrates are discussed.

Sie haben noch keine Lizenz? Dann Informieren Sie sich jetzt über unsere Produkte:

Springer Professional "Wirtschaft+Technik"

Online-Abonnement

Mit Springer Professional "Wirtschaft+Technik" erhalten Sie Zugriff auf:

  • über 102.000 Bücher
  • über 537 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Maschinenbau + Werkstoffe
  • Versicherung + Risiko

Jetzt Wissensvorsprung sichern!

Springer Professional "Technik"

Online-Abonnement

Mit Springer Professional "Technik" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 390 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Maschinenbau + Werkstoffe




 

Jetzt Wissensvorsprung sichern!

Springer Professional "Wirtschaft"

Online-Abonnement

Mit Springer Professional "Wirtschaft" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 340 Zeitschriften

aus folgenden Fachgebieten:

  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Versicherung + Risiko




Jetzt Wissensvorsprung sichern!

Literatur
1.
2.
Zurück zum Zitat K. Ramachandran, F. Liu, P.M. Raj, V. Sundaram, R. Tummala, J. Electron. Mater. 42, 348 (2013)CrossRef K. Ramachandran, F. Liu, P.M. Raj, V. Sundaram, R. Tummala, J. Electron. Mater. 42, 348 (2013)CrossRef
3.
Zurück zum Zitat K. Ramachandran, F. Liu, V. Sundaram, R. Tummala, IEEE Trans. Compon. Packaging Manuf. Technol. 3, 282 (2013)CrossRef K. Ramachandran, F. Liu, V. Sundaram, R. Tummala, IEEE Trans. Compon. Packaging Manuf. Technol. 3, 282 (2013)CrossRef
4.
Zurück zum Zitat C. Cohn, H. Kimbara, Electronics packaging technology conference (2007), p. 86 C. Cohn, H. Kimbara, Electronics packaging technology conference (2007), p. 86
5.
Zurück zum Zitat P.J. Boddy, R.H. Delaney, J.N. Lahti, E.F. Landry, R.C. Restrick. 14th Annual IEEE reliability physics symposium (1976), p. 108 P.J. Boddy, R.H. Delaney, J.N. Lahti, E.F. Landry, R.C. Restrick. 14th Annual IEEE reliability physics symposium (1976), p. 108
6.
Zurück zum Zitat J.N. Lathi, R.H. Delaney, J.N. Hines, 17th Annual proceedings of reliability physics (1979), p. 39 J.N. Lathi, R.H. Delaney, J.N. Hines, 17th Annual proceedings of reliability physics (1979), p. 39
7.
Zurück zum Zitat D.J. Lando, J.P. Mitchell, T.L. Welsher, 17th Annual proceeding of reliability physics (1979), p. 51 D.J. Lando, J.P. Mitchell, T.L. Welsher, 17th Annual proceeding of reliability physics (1979), p. 51
8.
Zurück zum Zitat K. Ramachandran, W.J. Ready, P.M. Raj, V. Sundaram, R. Tummala, J. Mater. Sci. Mater. El. 25, 1687 (2014)CrossRef K. Ramachandran, W.J. Ready, P.M. Raj, V. Sundaram, R. Tummala, J. Mater. Sci. Mater. El. 25, 1687 (2014)CrossRef
9.
10.
Zurück zum Zitat W.J. Ready, Ph.D. Thesis in Materials Science and Engineering, Georgia Institute of Technology (Atlanta, GA, 2000) W.J. Ready, Ph.D. Thesis in Materials Science and Engineering, Georgia Institute of Technology (Atlanta, GA, 2000)
11.
Zurück zum Zitat A. Caputo, L.J. Turbini, D.D. Perovic, J. Electron. Mater. 39, 85 (2010)CrossRef A. Caputo, L.J. Turbini, D.D. Perovic, J. Electron. Mater. 39, 85 (2010)CrossRef
12.
Zurück zum Zitat A. Caputo, L.J. Turbini, D.D. Perovic, J. Electron. Mater. 39, 92 (2010)CrossRef A. Caputo, L.J. Turbini, D.D. Perovic, J. Electron. Mater. 39, 92 (2010)CrossRef
13.
Zurück zum Zitat A. Caputo, L.J. Turbini, D.D. Perovic, J. Electron. Mater. 40, 1884 (2011)CrossRef A. Caputo, L.J. Turbini, D.D. Perovic, J. Electron. Mater. 40, 1884 (2011)CrossRef
14.
Zurück zum Zitat L.J. Turbini, W.R. Bent, W.J. Ready, J. Surf. Mt. Technol. 13, 10 (2000) L.J. Turbini, W.R. Bent, W.J. Ready, J. Surf. Mt. Technol. 13, 10 (2000)
15.
Zurück zum Zitat IPC-TM-650 2.6.25, Conductive anodic filament (CAF) resistance test: X–Y axis (The institute for interconnecting and packaging, electronic circuits, IPC, Northbrook, 2003) IPC-TM-650 2.6.25, Conductive anodic filament (CAF) resistance test: X–Y axis (The institute for interconnecting and packaging, electronic circuits, IPC, Northbrook, 2003)
19.
Zurück zum Zitat A. Wexler, in CRC Handbook of Chemistry and Physics, 89th edn (Internet Version 2009), ed. by D.R. Lide (CRC Press/Taylor and Francis, Boca Rotan, FL, 2009), pp. 15–33 A. Wexler, in CRC Handbook of Chemistry and Physics, 89th edn (Internet Version 2009), ed. by D.R. Lide (CRC Press/Taylor and Francis, Boca Rotan, FL, 2009), pp. 15–33
20.
Zurück zum Zitat R.A. Gerhardt, Encyclopedia of condensed matter physics (Elsevier Press, Amsterdam, 2005), pp. 350–363CrossRef R.A. Gerhardt, Encyclopedia of condensed matter physics (Elsevier Press, Amsterdam, 2005), pp. 350–363CrossRef
21.
Zurück zum Zitat W.J. Ready, L.J. Turbini, R. Nickel, J. Fischer, J. Electron. Mater. 28, 1158 (1999)CrossRef W.J. Ready, L.J. Turbini, R. Nickel, J. Fischer, J. Electron. Mater. 28, 1158 (1999)CrossRef
Metadaten
Titel
Investigation of copper plated-through-holes in glass fiber reinforced epoxy substrates using AC impedance spectroscopy
verfasst von
Koushik Ramachandran
Timothy L. Pruyn
Timothy Huang
Yushu Wang
Preet M. Singh
W. Jud Ready
Rosario A. Gerhardt
Venky Sundaram
Rao Tummala
Publikationsdatum
01.04.2015
Verlag
Springer US
Erschienen in
Journal of Materials Science: Materials in Electronics / Ausgabe 4/2015
Print ISSN: 0957-4522
Elektronische ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-015-2723-y

Weitere Artikel der Ausgabe 4/2015

Journal of Materials Science: Materials in Electronics 4/2015 Zur Ausgabe

Neuer Inhalt