Skip to main content

Journal of Electronic Materials

Ausgabe 6/2008

Inhalt (21 Artikel)

Open Access

Formation of Intermetallic Compounds Between Liquid Sn and Various CuNi x Metallizations

V. Vuorinen, H. Yu, T. Laurila, J.K. Kivilahti

Stress–Strain Characteristics of Tin-Based Solder Alloys for Drop-Impact Modeling

E.H. Wong, C.S. Selvanayagam, S.K.W. Seah, W.D. van Driel, J.F.J.M. Caers, X.J. Zhao, N. Owens, L.C. Tan, D.R. Frear, M. Leoni, Y.-S. Lai, C.-L. Yeh

Electromigration of Sn-9wt.%Zn Solder

Yu-Min Hung, Chih-Ming Chen

Effect of Pulse-Plated Nickel Barriers on Tin Whisker Growth for Pure Tin Solder Joints

Min-Na Chen, Shi-Jin Ding, Qing-Qing Sun, David Wei Zhang, Li-Kang Wang

Novel Cu/Cr/Ge/Pd Ohmic Contacts on Highly Doped n-GaAs

Kartika Chandra Sahoo, Chun-Wei Chang, Yuen-Yee Wong, Tung-Ling Hsieh, Edward Yi Chang, Ching-Ting Lee

Structural and Chemical Comparison of Graphite and BN/AlN Caps Used for Annealing Ion Implanted SiC

K.A. Jones, M.C. Wood, T.S. Zheleva, K.W. Kirchner, M.A. Derenge, A. Bolonikov, T.S. Sudarshan, R.D. Vispute, S.S. Hullavarad, S. Dhar

Preparation and Characterization of Polyimide/Zirconia Composite Films

Sea-Fue Wang, Yuh-Ruey Wang, Kuo-Chung Cheng, Jyh-Herng Chen, Yu-Ping Hsaio

Neuer Inhalt