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Erschienen in: Microsystem Technologies 10/2010

01.10.2010 | Technical Paper

Thermal analysis of helium-filled enterprise disk drive

verfasst von: Jiaping Yang, Cheng Peng Henry Tan, Eng Hong Ong

Erschienen in: Microsystem Technologies | Ausgabe 10/2010

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Abstract

Enterprise hard disk drives (HDDs) are widely used in high-end storage systems for data center. One of key performance requirements for enterprise HDDs is data access rate, which demands very high rotational speed (e.g. 15 k rpm or more) to permit fast access time. To reach such high speed, the disk spindle motor draws more power to spin and hence the temperature of HDD enclosure increases due to large windage loss. It has been known, temperature rise is one of the most fundamental factors that affect the reliability of the disk drive. In order to develop high reliable enterprise HDDs, thermal management of enterprise HDDs needs to be optimized to improve heat dissipation. One possible approach is to fill disk drive with helium because of its lower density and higher thermal conductivity. This paper investigates thermal performances of helium-filled enterprise disk drives through FEM simulations with experimental validations. Windage loss and heat convection of the HDD filled with helium and air are analysed. The simulated and measured temperature distributions of one commercial enterprise HDD with helium-filled and helium-air mixture are compared with those of an air-filled one. The results show 41% reduction of temperature rise of HDD enclosure can be achieved by filling with helium in comparison with that of air-filled HDD. It is also projected that in terms of equivalent cooling capability like air-filled HDD at 15 k rpm, helium-filled HDD spindle can spin up to 19 k rpm, which will greatly increase data access rate by 25% for future enterprise applications.

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Metadaten
Titel
Thermal analysis of helium-filled enterprise disk drive
verfasst von
Jiaping Yang
Cheng Peng Henry Tan
Eng Hong Ong
Publikationsdatum
01.10.2010
Verlag
Springer-Verlag
Erschienen in
Microsystem Technologies / Ausgabe 10/2010
Print ISSN: 0946-7076
Elektronische ISSN: 1432-1858
DOI
https://doi.org/10.1007/s00542-010-1121-x

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