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Erschienen in: Microsystem Technologies 3-4/2007

01.02.2007 | Technical Paper

Fabrication of RF MEMS variable capacitors by deep X-ray lithography and electroplating

verfasst von: Sven Achenbach, David Klymyshyn, Darcy Haluzan, Timo Mappes, Garth Wells, Jürgen Mohr

Erschienen in: Microsystem Technologies | Ausgabe 3-4/2007

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Abstract

Radio frequency micro electro-mechanical systems (RF MEMS) vertical cantilever variable capacitors fabricated using deep X-ray lithography and electroplating are presented. Polymethylmethacrylate (PMMA) layers of 100 μm and 150 μm have been patterned and electroplated with 70 μm and 100 μm thick nickel. A 3 μm thick titanium layer was used as plating base as well as etch time-controlled sacrificial layer for the release of the cantilever beam. The parallel plate layout includes narrow gaps and cantilever beams with an aspect ratio in nickel of up to 60 for 1 mm long features. Auxiliary structures support the beams and gaps during the processing. Room temperature electroplating significantly reduces the risk of deformations compared to the standard process temperature of 52°C. The capacitors operate in the 1–5 GHz range, and demonstrate good RF performance, with quality factors on the order of 170 at 1 GHz for a 1 pF capacitance.

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Metadaten
Titel
Fabrication of RF MEMS variable capacitors by deep X-ray lithography and electroplating
verfasst von
Sven Achenbach
David Klymyshyn
Darcy Haluzan
Timo Mappes
Garth Wells
Jürgen Mohr
Publikationsdatum
01.02.2007
Verlag
Springer-Verlag
Erschienen in
Microsystem Technologies / Ausgabe 3-4/2007
Print ISSN: 0946-7076
Elektronische ISSN: 1432-1858
DOI
https://doi.org/10.1007/s00542-006-0213-0

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