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Erschienen in: Journal of Materials Science: Materials in Electronics 14/2018

21.05.2018

Effects of Sn addition on the microstructure and properties of Bi–11Ag high-temperature solder

verfasst von: Limeng Yin, Dong Li, Zongxiang Yao, Gang Wang, Diganta Das, Michael Pecht

Erschienen in: Journal of Materials Science: Materials in Electronics | Ausgabe 14/2018

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Abstract

High-temperature lead-free Bi–11Ag solder with a Sn addition of 1, 3, and 5 wt% was investigated in this paper. The results show that the melting temperature of Bi–11Ag solders dropped from 265 to 255 °C after the addition of Sn, which is suitable for the high-temperature reflow process. When the addition of Sn was 3 wt% or less, dendrites in the microstructure would be refined, however, further additions of Sn show an opposite effect. The contact angle of Bi–11Ag–xSn (x = 0, 1, 3, 5 wt%) solders on the Cu substrate was measured, and the value decreased from 62° to 41° with the increasing of Sn content. The tensile strength of the Cu/Bi–11Ag–xSn solder/Cu sandwich structured microscale solder joint continues to increase from 43.3 to 53.9 MPa and the fracture position evolves from the solder/Cu interface to the middle of solder. In addition, according to EDS analysis of the solder/Cu interface, a Cu3Sn intermetallic compound (IMC) layer can be identified. The combination of this IMC layer and grain boundary grooving at the solder/Cu interface can effectively improve the strength of the Bi–11Ag–xSn solder joint.

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Metadaten
Titel
Effects of Sn addition on the microstructure and properties of Bi–11Ag high-temperature solder
verfasst von
Limeng Yin
Dong Li
Zongxiang Yao
Gang Wang
Diganta Das
Michael Pecht
Publikationsdatum
21.05.2018
Verlag
Springer US
Erschienen in
Journal of Materials Science: Materials in Electronics / Ausgabe 14/2018
Print ISSN: 0957-4522
Elektronische ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-018-9308-5

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