nach oben

Erschienen in:

11.12.2015

On the Accuracy of Elastic Strain Field Measurements by Laue Microdiffraction and High-Resolution EBSD: a Cross-Validation Experiment

verfasst von: E. Plancher, J. Petit, C. Maurice, V. Favier, L. Saintoyant, D. Loisnard, N. Rupin, J.-B. Marijon, O. Ulrich, M. Bornert, J.-S. Micha, O. Robach, O. Castelnau

Erschienen in: Experimental Mechanics | Ausgabe 3/2016

Einloggen

Aktivieren Sie unsere intelligente Suche, um passende Fachinhalte oder Patente zu finden.

search-config

KI-gestützte Suche

Aus

Abstract

Determining the accuracy of elastic strain measurements in plastically deformed alloys is an experimental challenge. To develop a novel cross-validation procedure, a controlled elasto-plastic strain gradient was created in a stainless steel single crystal by four point bending deformation. The corresponding elastic strain field was probed, with an intragranular spatial resolution, in-situ by Laue microdiffraction and ex-situ by High Resolution EBSD. Good agreement is found for the two independent measurements and the predictions of a mechanical model, at plastic strains below 0.5 %. The accuracy of the measurements is estimated at 3.2 × 10^{− 4}.

Vorheriger Artikel Principle and Experimental Validation of a new Apparatus Allowing Large Deformation in Pure Bending: Application to thin Wire

Nächster Artikel Shear Characterization of Adhesive Layers by Advanced Optical Techniques

Sie haben noch keine Lizenz? Dann Informieren Sie sich jetzt über unsere Produkte:

Springer Professional "Wirtschaft+Technik"

Online-Abonnement

Mit Springer Professional "Wirtschaft+Technik" erhalten Sie Zugriff auf:

über 102.000 Bücher
über 537 Zeitschriften

aus folgenden Fachgebieten:

Automobil + Motoren
Bauwesen + Immobilien
Business IT + Informatik
Elektrotechnik + Elektronik
Energie + Nachhaltigkeit
Finance + Banking
Management + Führung
Marketing + Vertrieb
Maschinenbau + Werkstoffe
Versicherung + Risiko

Jetzt Wissensvorsprung sichern!

Jetzt informieren

Springer Professional "Technik"

Online-Abonnement

Mit Springer Professional "Technik" erhalten Sie Zugriff auf:

über 67.000 Bücher
über 390 Zeitschriften

aus folgenden Fachgebieten:

Automobil + Motoren
Bauwesen + Immobilien
Business IT + Informatik
Elektrotechnik + Elektronik
Energie + Nachhaltigkeit
Maschinenbau + Werkstoffe

Jetzt Wissensvorsprung sichern!

Jetzt informieren

Ice GE, Pang JW (2009) Tutorial on x-ray microlaue diffraction. Mater Charact 60(11):1191–1201. doi:10.1016/j.matchar.2009.07.006 10.1016/j.matchar.2009.07.006 CrossRef

Wilkinson AJ, Meaden G, Dingley DJ (2006) High-resolution elastic strain measurement from electron backscatter diffraction patterns: New levels of sensitivity. Ultramicroscopy 106(4–5):307–313. doi:10.1016/j.ultramic.2005.10.001 CrossRef

Petit J, Castelnau O, Bornert M, Zhang FG, Hofmann F, Korsunsky, AM, Faurie D, Le Bourlot C, Micha JS, Robach O, Ulrich O (2015) Laue-DIC: a new method for improved stress field measurements at the micrometer scale. J Synchrotron Radiat 22(4):980–994. doi:10.1107/S1600577515005780 CrossRef

Petit J, Bornert M, Hofmann F et al (2012) Combining laue microdiffraction and digital image correlation for improved measurements of the elastic strain field with micrometer spatial resolution. Procedia IUTAM 4(0):133–143. doi:10.1016/j.piutam.2012.05.015 CrossRef

Chung JS, Ice GE (1999) Automated indexing for texture and strain measurement with broad-bandpass x-ray microbeams. J Appl Phys 86(9):5249–5255. doi:10.1063/1.371507 CrossRef

Hofmann F, Eve S, Belnoue J, Micha JS, Korsunsky AM (2011) Analysis of strain error sources in micro-beam laue diffraction. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 660(1):130–137. doi:10.1016/j.nima.2011.09.009 CrossRef

Villert S, Maurice C, Wyon C, Fortunier R (2009) Accuracy assessment of elastic strain measurement by EBSD. J Microsc 233(2):290–301. doi:10.1111/j.1365-2818.2009.03120.x CrossRefMathSciNet

Poshadel A, Dawson P, Johnson G (2012) Assessment of deviatoric lattice strain uncertainty for polychromatic x-ray microdiffraction experiments. J Synchrotron Radiat 19(2):237– 244CrossRef

Magid K, Florando J, Lassila D, LeBlanc M, Tamura N, Morris J (2009) Mapping mesoscale heterogeneity in the plastic deformation of a copper single crystal. Phil Mag 89(1):77–107. doi:10.1080/14786430802558577 CrossRef

10.

Jiang J, Britton TB, Wilkinson AJ (2013) Mapping type III intragranular residual stress distributions in deformed copper polycrystals. Acta Materialia 61(15):5895–5904CrossRef

11.

Larson BC, Levine LE (2013) Submicrometre-resolution polychromatic three-dimensional x-ray microscopy. J Appl Crystallogr 46(1):153–164CrossRef

12.

Maurice C, Driver JH, Fortunier R, On solving the orientation gradient dependency of high angular resolution EBSD (2012). Ultramicroscopy 113(0):171–181. doi:10.1016/j.ultramic.2011.10.013 CrossRef

13.

Britton T, Wilkinson A (2012) High resolution electron backscatter diffraction measurements of elastic strain variations in the presence of larger lattice rotations. Ultramicroscopy 114(0):82–95. doi:10.1016/j.ultramic.2012.01.004 CrossRef

14.

Britton T, Maurice C, Fortunier R, Driver J, Day A, Meaden G, Dingley D, Mingard K, Wilkinson A (2010) Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patterns. Ultramicroscopy 110(12):1443–1453. doi:10.1016/j.ultramic.2010.08.001 CrossRef

15.

Maurice C, Dzieciol K, Fortunier R (2011) A method for accurate localisation of EBSD pattern centres. Ultramicroscopy 111(2):140–148. doi:10.1016/j.ultramic.2010.10.007 CrossRef

16.

Mingard K, Day A, Maurice C, Quested P (2011) Towards high accuracy calibration of electron backscatter diffraction systems. Ultramicroscopy 111(5):320–329CrossRef

17.

Barabash RI, Ice GE, Liu W, Barabash OM (2009) Polychromatic microdiffraction characterization of defect gradients in severely deformed materials. Micron 40(1):28–36. doi:10.1016/j.micron.2008.03.010 CrossRef

18.

Zhang FG, Castelnau O, Bornert M, Petit J, Marijon JB, Plancher E (2015) Determination of deviatoric elastic strain and lattice orientation by applying digital image correlation to Laue microdiffraction images — the enhanced Laue-DIC method. J Appl Crystallogr 48(6). doi:10.1107/S1600576715018397

19.

Nolze G (2007) Image distortions in sem and their influences on ebsd measurements. Ultramicroscopy 107 (2):172–183CrossRefMathSciNet

20.

Vaudin M, Stan G, Gerbig Y, Cook R (2011) High resolution surface morphology measurements using EBSD cross-correlation techniques and AFM. Ultramicroscopy 111(8):1206–1213. doi:10.1016/j.ultramic.2011.01.039 CrossRef

21.

Robach O, Kirchlechner C, Micha JS et al (2014) Strain and dislocation gradients from diffraction, chap. 5 : Laue microdiffraction at ESRF, pp 156–204. Imperial College Press / World Scientific Publishing

22.

Ulrich O, Biquard X, Bleuet P, Geaymond O, Gergaud P, Micha JS, Robach O, Rieutord F (2011) A new white beam x-ray microdiffraction setup on the BM32 beamline at the european synchrotron radiation facility. Rev Sci Instrum 82(3). doi:10.1063/1.3555068

23.

Bandyopadhyay P, Segre CU Mucal on the web. http://www.csrri.iit.edu/periodic-table.html

24.

Drouin D, Couture AR, Joly D, Tastet X, Aimez V, Gauvin R (2007) Casino v2.42 a fast and easy-to-use modeling tool for scanning electron microscopy and microanalysis users. Scanning 29(3):92–101

25.

Boehler JP, Sawczuk A (1977) On yielding of oriented solids. Acta Mech 27(1-4):185–204CrossRef

26.

Ledbetter H (1981) Predicted single-crystal elastic constants of stainless-steel 316. BR J NDT 23(6):286–287

27.

Chambreuil-Paret A (1997) Ph.D. thesis, Ecole Nationale des Mines de Saint-Etienne / Institut Polytechnique de Grenoble (France). http://www.iaea.org/inis/collection/NCLCollectionStore/%_Public/29/040/29040011.pdf

Titel: On the Accuracy of Elastic Strain Field Measurements by Laue Microdiffraction and High-Resolution EBSD: a Cross-Validation Experiment
verfasst von: E. Plancher
J. Petit
C. Maurice
V. Favier
L. Saintoyant
D. Loisnard
N. Rupin
J.-B. Marijon
O. Ulrich
M. Bornert
J.-S. Micha
O. Robach
O. Castelnau
Publikationsdatum: 11.12.2015
Verlag: Springer US
Erschienen in: Experimental Mechanics / Ausgabe 3/2016
Print ISSN: 0014-4851
Elektronische ISSN: 1741-2765
DOI: https://doi.org/10.1007/s11340-015-0114-1

Premium Partner

Marktübersichten

Die im Laufe eines Jahres in der „adhäsion“ veröffentlichten Marktübersichten helfen Anwendern verschiedenster Branchen, sich einen gezielten Überblick über Lieferantenangebote zu verschaffen.

Zur Marktübersicht

Springer Professional

Abstract

Bitte loggen Sie sich ein, um Zugang zu Ihrer Lizenz zu erhalten.

Sie haben noch keine Lizenz? Dann Informieren Sie sich jetzt über unsere Produkte:

Springer Professional "Wirtschaft+Technik"

Springer Professional "Technik"

Weitere Artikel der Ausgabe 3/2016

Principle and Experimental Validation of a new Apparatus Allowing Large Deformation in Pure Bending: Application to thin Wire

Incremental Hole Drilling for Residual Stress Analysis of Strongly Textured Material States – A New Calibration Approach

Drop Tower Adaptation for Medium Strain Rate Tensile Testing

Time-resolved full-field imaging of ultrasonic Lamb waves using deflectometry

Shear Characterization of Adhesive Layers by Advanced Optical Techniques

Three-Dimensional Phase Evaluation in ESPI by Using a Non-Cube Beam-Splitter

Premium Partner

Marktübersichten