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Physics of Metals and Metallography
Erschienen in: Physics of Metals and Metallography 3/2021

01.03.2021 | ELECTRICAL AND MAGNETIC PROPERTIES

Influence of the Parameters of Permalloy-Based Multilayer Film Structures on the Sensitivity of Magnetic Impedance Effect

verfasst von: N. A. Buznikov, A. V. Svalov, G. V. Kurlyandskaya

Erschienen in: Physics of Metals and Metallography | Ausgabe 3/2021

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Abstract

The effect of the number and thickness of permalloy layers and the thickness and material of interlayers on the value of magnetic impedance (MI) effect of multilayer film structures is theoretically analyzed in this work. The distributions of electromagnetic fields over the thickness of the film structure and MI are obtained on the basis of the joint solution of the Maxwell equations and the Landau–Lifshitz equation. The performed analysis shows that the MI increases with decreasing number of permalloy layers and corresponding increase in their thickness. It is established that the values of conductivities of the central nonmagnetic layer and interlayers influence the MI value differently. It is predicted that a further increase in MI may be achieved by using interlayers made of ferromagnetic materials.
Vorheriger Artikel Transformations of the Domain-Wall Fine Structure in the Course of Magnetization Change Processes in Co(0001) Film
Nächster Artikel Dielectric Function of a Spherical Metallic Nanoparticle

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Metadaten
Titel
Influence of the Parameters of Permalloy-Based Multilayer Film Structures on the Sensitivity of Magnetic Impedance Effect
verfasst von
N. A. Buznikov
A. V. Svalov
G. V. Kurlyandskaya
Publikationsdatum
01.03.2021
Verlag
Pleiades Publishing
Erschienen in
Physics of Metals and Metallography / Ausgabe 3/2021
Print ISSN: 0031-918X
Elektronische ISSN: 1555-6190
DOI
https://doi.org/10.1134/S0031918X21030029

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