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Erschienen in: Journal of Electronic Testing 2/2014

01.04.2014

Low Cost Signal Reconstruction Based Testing of RF Components using Incoherent Undersampling

verfasst von: Debesh Bhatta, Aritra Banerjee, Sabyasachi Deyati, Nicholas Tzou, Abhijit Chatterjee

Erschienen in: Journal of Electronic Testing | Ausgabe 2/2014

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Abstract

To meet the testing requirements of high speed components used in modern communication systems, in an efficient and cost effective manner, it is necessary to develop new device performance measurement techniques that are easily scalable to high frequencies. Traditional up/down conversion based transmitter testing architectures are sensitive to the linearity of the mixers and carrier phase noise in the receiver. Direct undersampling based test instrumentation can overcome the limitations imposed by mixers in up/down conversion. A major challenge in direct undersampling based test architecture is to achieve precise phase alignment between different components of the test setup. Such phase alignment of high frequency signals requires the use of expensive test instruments adding to the cost and complexity of the overall test system. To resolve this problem, an incoherent undersampling based test method is developed in this research that eliminates the need for precise phase synchronization between the RF test signal carrier, its amplitude-modulated envelope (generally necessary for measuring amplifier nonlinearity) and the reference sampling clock. A side-benefit, due to the use of signal undersampling, is that signal acquisition is achieved without the use of a Nyquist rate data converter. Multiple RF performance metrics are extracted without the use of a reference receiver. The accuracy of the proposed setup is compared against existing coherent sampling based test setups.

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Metadaten
Titel
Low Cost Signal Reconstruction Based Testing of RF Components using Incoherent Undersampling
verfasst von
Debesh Bhatta
Aritra Banerjee
Sabyasachi Deyati
Nicholas Tzou
Abhijit Chatterjee
Publikationsdatum
01.04.2014
Verlag
Springer US
Erschienen in
Journal of Electronic Testing / Ausgabe 2/2014
Print ISSN: 0923-8174
Elektronische ISSN: 1573-0727
DOI
https://doi.org/10.1007/s10836-014-5442-z

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