Journal of Electronic Testing

Editorial

Vishwani D. Agrawal

Test Technology Newsletter

An On-Chip Sensor to Monitor NBTI Effects in SRAMs

A. Ceratti, T. Copetti, L. Bolzani, F. Vargas, R. Fagundes

An RTN Variation Tolerant SRAM Screening Test Design with Gaussian Mixtures Approximations of Long-Tail Distributions

Worawit Somha, Hiroyuki Yamauchi

Error Correction Schemes with Erasure Information for Fast Memories

Samuel Evain, Valentin Savin, Valentin Gherman

Developing Inherently Resilient Software Against Soft-Errors Based on Algorithm Level Inherent Features

Bahman Arasteh, Seyed Ghassem Miremadi, Amir Masoud Rahmani

Low Cost Signal Reconstruction Based Testing of RF Components using Incoherent Undersampling

Debesh Bhatta, Aritra Banerjee, Sabyasachi Deyati, Nicholas Tzou, Abhijit Chatterjee

A Test Time Theorem and its Applications

Praveen Venkataramani, Suraj Sindia, Vishwani D. Agrawal

Test Data Compression for System-on-a-Chip using Count Compatible Pattern Run-Length Coding

Haiying Yuan, Jiaping Mei, Hongying Song, Kun Guo

Soft Fault Diagnosis of Analog Circuits via Frequency Response Function Measurements

Yongle Xie, Xifeng Li, Sanshan Xie, Xuan Xie, Qizhong Zhou