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Erschienen in: Measurement Techniques 2/2017

01.07.2017 | NANOMETROLOGY

Method for Certification Monitoring of Surface Inhomogeneities of Optics Based on Frequency Analysis of the Surface Profile

verfasst von: D. G. Denisov, N. V. Baryshnikov, Ya. V. Gladysheva, V. E. Karasik, A. B. Morozov, V. E. Patrikeev

Erschienen in: Measurement Techniques | Ausgabe 2/2017

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Abstract

A method for determining the rms deviation of the heights of surface inhomogeneities based on an algorithm for calculating the spectral density of the one-dimensional correlation function over a wide range of spatial frequencies is developed and justified scientifically. The methodological errors of the algorithm are analyzed using experimental data from studies on a test stand under production conditions.

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Metadaten
Titel
Method for Certification Monitoring of Surface Inhomogeneities of Optics Based on Frequency Analysis of the Surface Profile
verfasst von
D. G. Denisov
N. V. Baryshnikov
Ya. V. Gladysheva
V. E. Karasik
A. B. Morozov
V. E. Patrikeev
Publikationsdatum
01.07.2017
Verlag
Springer US
Erschienen in
Measurement Techniques / Ausgabe 2/2017
Print ISSN: 0543-1972
Elektronische ISSN: 1573-8906
DOI
https://doi.org/10.1007/s11018-017-1160-0

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