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Erschienen in:
01.06.2009
Microstructures and microwave dielectric properties of low-temperature sintered Ca2Zn4Ti15O36 ceramics
Erschienen in: Journal of Materials Science: Materials in Electronics | Ausgabe 6/2009
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Abstract
Low-temperature sintered Ca2Zn4Ti15O36 microwave dielectric ceramic was prepared by conventional solid state reaction method. The influences from V2O5 addition on the sintering behavior, crystalline phases, microstructures and microwave dielectric properties were investigated. The crystalline phases and microstructures of Ca2Zn4Ti15O36 ceramic with V2O5 addition were investigated by X-ray diffraction, scanning electron microscopy (SEM) and energy dispersive X-ray spectroscopy (EDS). V2O5 addition lowered the sintering temperature of Ca2Zn4Ti15O36 ceramics from 1140 °C to 930 °C. Ca2Zn4Ti15O36 ceramic with 5wt% V2O5 addition could be densified well at 930 °C, and showed good microwave dielectric properties of εr ~ 46, Q × f ~ 13400 GHz, and temperature coefficient of resonant frequency (τf) ~ 164 ppm/°C.