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Journal of Materials Science: Materials in Electronics
Erschienen in: Journal of Materials Science: Materials in Electronics 5/2018

28.11.2017

Photoelectrocatalytic degradation of sugarcane factory wastewater using WO3/ZnO thin films

verfasst von: Y. M. Hunge, A. A. Yadav, B. M. Mohite, V. L. Mathe, C. H. Bhosale

Erschienen in: Journal of Materials Science: Materials in Electronics | Ausgabe 5/2018

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Abstract

In the present work, layered WO3/ZnO thin films have been prepared by simple chemical spray pyrolysis method. As prepared films are characterized by photoelectrochemical (PEC) solar cell, X-ray diffraction (XRD), Raman spectroscopy, Field emission scanning electron microscopy (FE-SEM), Brunauer–Emmer–Teller (BET) and energy dispersive X-ray spectroscopy techniques. XRD analysis reveals the formation of hexagonal and monoclinic phases of ZnO and WO3 respectively. Raman analysis confirms the formation of layered WO3/ZnO thin films. FE-SEM images demonstrate that the surface morphology of layered WO3/ZnO consists of nano balls like morphology. The specific surface area of the layered WO3/ZnO thin film is found to be 65.12 m2 g−1. The photoelectrocatalytic degradation properties of layered WO3/ZnO thin films were investigated by studying degradation of sugarcane factory wastewater. The end result shows that the degradation percentage of sugarcane factory wastewater using layered WO3/ZnO photo electrode has reached 94.44% after 100 min. under sunlight illumination.
Vorheriger Artikel Low temperature bonding with high shear strength using micro-sized Ag particle paste for power electronic packaging
Nächster Artikel Solid-silica core/mesoporous-silica shell composite abrasives: synthesis, characterization, and the effect of mesoporous shell structures on CMP

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Metadaten
Titel
Photoelectrocatalytic degradation of sugarcane factory wastewater using WO3/ZnO thin films
verfasst von
Y. M. Hunge
A. A. Yadav
B. M. Mohite
V. L. Mathe
C. H. Bhosale
Publikationsdatum
28.11.2017
Verlag
Springer US
Erschienen in
Journal of Materials Science: Materials in Electronics / Ausgabe 5/2018
Print ISSN: 0957-4522
Elektronische ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-017-8316-1

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