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2019 | OriginalPaper | Buchkapitel

10. Photoemission Electron Microscopy

verfasst von : Jun Feng, Andreas Scholl

Erschienen in: Springer Handbook of Microscopy

Verlag: Springer International Publishing

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Abstract

Photoemission electron microscopy (PEEM) is a cathode lens electron microscopy technique. This specialized electron microscopy technique excels in studying the morphology, electronic and chemical properties and the magnetic structure of surfaces and thin film materials with nanometer-scale spatial resolution. In this chapter, we describe X-PEEM instrumentation and a typical X-PEEM optical system, discuss aberrations that limit the optical performance of X-PEEM microscopes, describe contrast mechanisms, and present several examples that cover some of the common use cases for X-PEEM, in particular the magnetic and time-resolved microscopy of nanostructures.

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Titel: Photoemission Electron Microscopy
verfasst von: Jun Feng
Andreas Scholl
Verlag: Springer International Publishing
Buch: Springer Handbook of Microscopy
Print ISBN: 978-3-030-00068-4

Electronic ISBN: 978-3-030-00069-1

Copyright-Jahr: 2019
DOI: https://doi.org/10.1007/978-3-030-00069-1_10

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