Skip to main content
Erschienen in: Metallography, Microstructure, and Analysis 3/2017

05.05.2017 | Feature

Quantitative Characterization of Microscale Fracture Features in Titanium Alloys

verfasst von: V. Sinha, S. K. Jha, A. L. Pilchak, W. J. Porter III, R. John, J. M. Larsen

Erschienen in: Metallography, Microstructure, and Analysis | Ausgabe 3/2017

Einloggen

Aktivieren Sie unsere intelligente Suche, um passende Fachinhalte oder Patente zu finden.

search-config
loading …

Abstract

Quantification of the fracture mechanisms is important for design and sustainment of fatigue–critical components and for improved life prediction models. The traditional fractography in a scanning electron microscope (SEM) provides important, but qualitative, information on fracture mechanisms. In this study, the fatigue fracture features at the crack-initiation site in a near-α titanium alloy were characterized quantitatively in an SEM. The crack initiated in a surface-located primary α grain, with the resultant formation of a facet. A serrated feature was observed on the fatigue crack-initiating facet within an α grain for the first time in this study. The spatial orientations of the crack-initiating facet and the fracture lines forming the serration were determined in 3D with the quantitative tilt fractography technique, which consists of analyzing an SEM image pair acquired at different stage tilt angles. The electron backscatter diffraction (EBSD) data were collected nondestructively from the grain associated with faceted crack-initiation, without recourse to cross-sectional polishing. Combining the spatial orientation and the EBSD data established that the facet plane was basal and the lines forming the serrated feature were along 〈a〉 \( \left(\text{i.e.,}\; {\left\langle {2\bar{1}\bar{1}0} \right\rangle } \right) \)-type slip directions. The methodology presented in this study is applicable to quantification of crystallography for other planar and linear features in crystalline materials.

Sie haben noch keine Lizenz? Dann Informieren Sie sich jetzt über unsere Produkte:

Springer Professional "Wirtschaft+Technik"

Online-Abonnement

Mit Springer Professional "Wirtschaft+Technik" erhalten Sie Zugriff auf:

  • über 102.000 Bücher
  • über 537 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Maschinenbau + Werkstoffe
  • Versicherung + Risiko

Jetzt Wissensvorsprung sichern!

Springer Professional "Technik"

Online-Abonnement

Mit Springer Professional "Technik" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 390 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Maschinenbau + Werkstoffe




 

Jetzt Wissensvorsprung sichern!

Literatur
1.
Zurück zum Zitat M.J. Blackburn, J.C. Williams, Metallurgical aspects of the stress corrosion cracking of Titanium alloys, Proceedings of Conference on the Fundamental Aspects of Stress Corrosion Cracking, NACE, p 620 (1969) M.J. Blackburn, J.C. Williams, Metallurgical aspects of the stress corrosion cracking of Titanium alloys, Proceedings of Conference on the Fundamental Aspects of Stress Corrosion Cracking, NACE, p 620 (1969)
2.
Zurück zum Zitat J. Kameda, R. Inoguchi, D.J. Prior, T. Kogure, Morphological analyses of minute crystals by using stereo-photogrammetric scanning electron microscopy and electron back-scattered diffraction. J. Microsc. 228(Pt 3), 358–365 (2007)CrossRef J. Kameda, R. Inoguchi, D.J. Prior, T. Kogure, Morphological analyses of minute crystals by using stereo-photogrammetric scanning electron microscopy and electron back-scattered diffraction. J. Microsc. 228(Pt 3), 358–365 (2007)CrossRef
3.
Zurück zum Zitat S. Ghosh, M. Mills, S. Rokhlin, V. Sinha, W. Soboyejo, J. Williams (2007) The evaluation of cold dwell fatigue in Ti-6242”, Final Report, Federal Aviation Administration, DOT/FAA/AR-06/24 S. Ghosh, M. Mills, S. Rokhlin, V. Sinha, W. Soboyejo, J. Williams (2007) The evaluation of cold dwell fatigue in Ti-6242”, Final Report, Federal Aviation Administration, DOT/FAA/AR-06/24
4.
Zurück zum Zitat D.J. Dingley, S.I. Wright, M.M. Nowell, Dynamic background correction of electron backscatter diffraction patterns. Microsc. Microanal. 11(Suppl 2), 528–529 (2005) D.J. Dingley, S.I. Wright, M.M. Nowell, Dynamic background correction of electron backscatter diffraction patterns. Microsc. Microanal. 11(Suppl 2), 528–529 (2005)
5.
Zurück zum Zitat S.K. Jha, C.J. Szczepanski, P.J. Golden, W.J. Porter III, R. John, Characterization of fatigue crack-initiation facets in relation to lifetime variability in Ti–6Al–4V. Int. J. Fatigue 42, 248–257 (2012)CrossRef S.K. Jha, C.J. Szczepanski, P.J. Golden, W.J. Porter III, R. John, Characterization of fatigue crack-initiation facets in relation to lifetime variability in Ti–6Al–4V. Int. J. Fatigue 42, 248–257 (2012)CrossRef
6.
Zurück zum Zitat J. Miao, T.M. Pollock, J.W. Jones, Acta Mater. 57, 5964–5974 (2009)CrossRef J. Miao, T.M. Pollock, J.W. Jones, Acta Mater. 57, 5964–5974 (2009)CrossRef
7.
Zurück zum Zitat J. Miao, T.M. Pollock and J.W. Jones, Superalloys 2008, pp. 589–597 J. Miao, T.M. Pollock and J.W. Jones, Superalloys 2008, pp. 589–597
8.
Zurück zum Zitat G. Themelis, S. Chikwembani, J. Weertman, Mater. Charact. 24, 27 (1990)CrossRef G. Themelis, S. Chikwembani, J. Weertman, Mater. Charact. 24, 27 (1990)CrossRef
9.
Zurück zum Zitat V. Sinha, M.J. Mills, J.C. Williams, J. Mater. Sci. 42(19), 8334–8341 (2007)CrossRef V. Sinha, M.J. Mills, J.C. Williams, J. Mater. Sci. 42(19), 8334–8341 (2007)CrossRef
10.
Zurück zum Zitat Y.J. Ro, S.R. Agnew, R.P. Gangloff, Uncertainty in the determination of fatigue crack facet crystallography. Scripta Mater. 52, 531–536 (2005)CrossRef Y.J. Ro, S.R. Agnew, R.P. Gangloff, Uncertainty in the determination of fatigue crack facet crystallography. Scripta Mater. 52, 531–536 (2005)CrossRef
11.
Zurück zum Zitat F.J. Humphreys, Grain and subgrain characterisation by electron backscatter diffraction. J. Mater. Sci. 36, 3833–3854 (2001)CrossRef F.J. Humphreys, Grain and subgrain characterisation by electron backscatter diffraction. J. Mater. Sci. 36, 3833–3854 (2001)CrossRef
12.
Zurück zum Zitat M. Kamaya, Assessment of local deformation using EBSD: quantification of accuracy of measurement and definition of local gradient. Ultramicroscopy 111, 1189–1199 (2011)CrossRef M. Kamaya, Assessment of local deformation using EBSD: quantification of accuracy of measurement and definition of local gradient. Ultramicroscopy 111, 1189–1199 (2011)CrossRef
13.
14.
Zurück zum Zitat V. Sinha, M.J. Mills, J.C. Williams, Metall. Mater. Trans. A 37A, 2015–2026 (2006)CrossRef V. Sinha, M.J. Mills, J.C. Williams, Metall. Mater. Trans. A 37A, 2015–2026 (2006)CrossRef
15.
Zurück zum Zitat A.L. Pilchak, A. Bhattacharjee, A.H. Rosenberger, J.C. Williams, Low ∆K faceted crack growth in titanium alloys. Int. J. Fatigue 31, 989–994 (2009)CrossRef A.L. Pilchak, A. Bhattacharjee, A.H. Rosenberger, J.C. Williams, Low ∆K faceted crack growth in titanium alloys. Int. J. Fatigue 31, 989–994 (2009)CrossRef
16.
Zurück zum Zitat A.L. Pilchak, R.E.A. Williams, J.C. Williams, Crystallography of fatigue crack initiation and growth in fully lamellar Ti–6Al–4V. Metall. Mater. Trans. A 41A, 106–124 (2010)CrossRef A.L. Pilchak, R.E.A. Williams, J.C. Williams, Crystallography of fatigue crack initiation and growth in fully lamellar Ti–6Al–4V. Metall. Mater. Trans. A 41A, 106–124 (2010)CrossRef
17.
Zurück zum Zitat J.R. Michael, B.B. McKenzie, D.F. Susan, Application of electron backscatter diffraction for crystallographic characterization of tin whiskers. Microsc. Microanal. 18, 876–884 (2012)CrossRef J.R. Michael, B.B. McKenzie, D.F. Susan, Application of electron backscatter diffraction for crystallographic characterization of tin whiskers. Microsc. Microanal. 18, 876–884 (2012)CrossRef
18.
Zurück zum Zitat L. Vescan, K. Grimm, C. Dieker, Facet investigation in selective epitaxial growth of Si and SiGe on (001) Si for optoelectronic devices. J. Vac. Sci. Technol., B 16, 1549 (1998)CrossRef L. Vescan, K. Grimm, C. Dieker, Facet investigation in selective epitaxial growth of Si and SiGe on (001) Si for optoelectronic devices. J. Vac. Sci. Technol., B 16, 1549 (1998)CrossRef
19.
Zurück zum Zitat C.I. Drowley, G.A. Reid, R. Hull, Model for facet and sidewall defect formation during selective epitaxial growth of (001) silicon. Appl. Phys. Lett. 52, 546 (1988)CrossRef C.I. Drowley, G.A. Reid, R. Hull, Model for facet and sidewall defect formation during selective epitaxial growth of (001) silicon. Appl. Phys. Lett. 52, 546 (1988)CrossRef
Metadaten
Titel
Quantitative Characterization of Microscale Fracture Features in Titanium Alloys
verfasst von
V. Sinha
S. K. Jha
A. L. Pilchak
W. J. Porter III
R. John
J. M. Larsen
Publikationsdatum
05.05.2017
Verlag
Springer US
Erschienen in
Metallography, Microstructure, and Analysis / Ausgabe 3/2017
Print ISSN: 2192-9262
Elektronische ISSN: 2192-9270
DOI
https://doi.org/10.1007/s13632-017-0347-8

Weitere Artikel der Ausgabe 3/2017

Metallography, Microstructure, and Analysis 3/2017 Zur Ausgabe

    Marktübersichten

    Die im Laufe eines Jahres in der „adhäsion“ veröffentlichten Marktübersichten helfen Anwendern verschiedenster Branchen, sich einen gezielten Überblick über Lieferantenangebote zu verschaffen.