Ausgabe 11/2020
Inhalt (12 Artikel)
STATE STANDARDS
GET 183-2019: State Primary Special Standard of the Unit of Length in the Field of Measurements of the Parameters of Deviations of Optical Surfaces from Flatness
D. A. Novikov, E. A. Milovanova, N. V. Ivannikova, N. A. Tabachnikova
GENERAL PROBLEMS OF METROLOGY AND MEASUREMENT TECHNIQUE
Definitional Uncertainty and Error of Inadequacy
S. F. Levin
LINEAR AND ANGULAR MEASUREMENTS
The use of Morphological Filtration in the Problem of Diagnosing the State of the Surface of a Cutting Tool
D. A. Masterenko, E. S. Skoptsov
OPTOPHYSICAL MEASUREMENTS
Error Estimate for Lidar Measurements of Concentration during Probing of Atmospheric Mixtures of Hydrogen Sulfide and Methane Molecules
V. E. Privalov, V. G. Shemanin
TIME AND FREQUENCY MEASUREMENTS
Metrological Support of Generation 5g Communication Networks
R. I. Balaev, I. Yu. Blinov, A. N. Malimon, M. L. Shvarts
THERMOPHYSICAL MEASUREMENTS
Express Analysis of the Dependence of the Critical Temperature of Superconducting Film on its Thickness
А. V. Merenkov, V. I. Chichkov, S. V. Shitov
RADIO MEASUREMENTS
Construction of Two-Dimensional Regression Models of the Current-voltage Characteristics of the Output Current of Field-Effect Transistors Using the PLExp Information System
N. Yu. Baturina, I. V. Kalienko
ACOUSTIC MEASUREMENTS
Experimental Estimation of the Sources of Measurement Uncertainty of the Total Power of an Ultrasound Beam in Water by the Method of Plane Scanning of the Beam Cross Section
A. M. Enyakov, S. I. Kuznetsov, G. S. Lukin
PHYSICOCHEMICAL MEASUREMENTS
Method of Spectral Ellipsometric Evaluation of the Phase Composition of Multilayer Films and Metal-Oxide Structures in the Process of their Growth
D. N. Tyurin, V. A. Kotenev, A. Yu. Tsivadze
Evaluation of the Zr, Y, and Gd Contents in Targets for Magnetron Spraying of Heat-Shielding Coatings Based on Zirconium
F. N. Karachevtsev, R. M. Dvoretskov, E. A. Mikheeva
Correction
Correction to: “Measuring the Speed of Data Exchange in Memory Cards Using Programmable Logic Integrated Circuits”
E. V. Kostikova, S. A. Seliverstov, Ya. A. Seliverstov, Sh. S. Fahmi