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Erschienen in:
1978 | OriginalPaper | Buchkapitel
Spurious peaks in X-ray diffractograms
verfasst von : R. Jenkins, J. L. de Vries
Erschienen in: Worked Examples in X-Ray Analysis
Verlag: Macmillan Education UK
Enthalten in: Professional Book Archive
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Adiffractogram of quartz exhibited an additional spurious peak at approximately 6° (2θ).The effect was observed both in specimens containing only low atomic number elements and specimens containing high atomic number elements. The patterns were always taken using Cu radiation, proportional counter (Xe-filled) and pulse height selection. The pulse height selector was set at the 45% acceptance level since the resolution of the counter (peak width at half height) was 18% for Cu Kα radiation.