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Erschienen in: Journal of Materials Science: Materials in Electronics 13/2019

28.05.2019

Structural and electromagnetic properties of nano cobalt ferrite polymeric thin film

verfasst von: Rishu Prasad, S. K. S. S Parashar

Erschienen in: Journal of Materials Science: Materials in Electronics | Ausgabe 13/2019

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Abstract

Synthesis of nano cobalt ferrite (NCF) was done by sol–gel auto combustion method. The effect of nano CoFe2O4 on structural and electromagnetic properties of polyvinyl alcohol (PVA) was evaluated on polymer based thin films. Polymer based nano CoFe2O4 was synthesised using solvent casting method having different concentration (0%, 2%, 4% and 6%) of nano CoFe2O4. Scanning electron microscopy (SEM) was employed for understanding the surface phenomenon like development of porosity and agglomeration caused by NCF in the PVA matrix. SEM analysis indicated the uniform dispersion of cobalt ferrite in 2% and 4%, it was also observed that further increase in concentration of 6% results to development of porosity on the surface of thin film. Fourier Transform Infrared (FTIR) were employed for understating the active functional groups. Vector Network Analyser (VNA) was employed to characterize the dielectric constant and scattering parameter (S11, S21) in X—band for understanding materialistic and electromagnetic behaviour of polymer based thin film. The value of electromagnetic dielectric decreases with the increase in concentration of Cobalt Ferrite which signifies the restriction in electron motion due to increase in doping concentration. Reflection coefficient (S11) increases from − 32 to − 45 dB with increase in concentration (0–4%) of CoFe2O4 due to surface smoothness whereas it decreased at 6% doping due to development of porosity. Transmission coefficient (S21) decreases with increases in concentration of CoFe2O4 due to formation of interconnected dipoles.

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Metadaten
Titel
Structural and electromagnetic properties of nano cobalt ferrite polymeric thin film
verfasst von
Rishu Prasad
S. K. S. S Parashar
Publikationsdatum
28.05.2019
Verlag
Springer US
Erschienen in
Journal of Materials Science: Materials in Electronics / Ausgabe 13/2019
Print ISSN: 0957-4522
Elektronische ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-019-01559-8

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