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Erschienen in:
01.04.2008
Thickness dependence of refractive index and optical gap of PMMA layers prepared under electrical field
Erschienen in: Journal of Materials Science: Materials in Electronics | Ausgabe 4/2008
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Abstract
Optical parameters (refractive index, dispersion energy, optical gap) of polymethylmethacrylate (PMMA) layers prepared by spin coating and modified by electric field have been studied. Refractive index was measured using a refractometer, internal structure was investigated as a structural parameter (E
d) within the One Oscillator Model. Optical gap width (E
g
opt
) was assessed using Tauc Approximation from UV-Vis spectra. Surface morphology and roughness was investigated using an AFM. The electric field imposed during preparation of layers increases their refractive index. The highest increase in n (Δn = 0.042) was found for the thinnest PMMA layer (70 nm). Oriented layers have produced higher E
g
opt
than non-oriented ones for all studied values of thickness. The electrical field applied at preparation of the oriented layer will not change its surface morphology and roughness.