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Erschienen in: Microsystem Technologies 8/2015

01.08.2015 | Technical Paper

Analytical expressions for the electrostatically actuated curled beam problem

verfasst von: Mohammad I. Younis

Erschienen in: Microsystem Technologies | Ausgabe 8/2015

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Abstract

This works presents analytical expressions of the electrostatically actuated initially deformed cantilever beam problem. The formulation is based on the continuous Euler–Bernoulli beam model combined with a single-mode Galerkin approximation. We derive simple analytical expressions for two commonly observed deformed beams configurations: the curled and tilted configurations. The derived analytical formulas are validated by comparing their results to experimental data and numerical results of a multi-mode reduced order model. The derived expressions do not involve any complicated integrals or complex terms and can be conveniently used by designers for quick, yet accurate, estimations. The formulas are found to yield accurate results for most commonly encountered microbeams of initial tip deflections of few microns. For largely deformed beams, we found that these formulas yield less accurate results due to the limitations of the single-mode approximation. In such cases, multi-mode reduced order models are shown to yield accurate results.

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Literatur
Zurück zum Zitat Andreaus U, Placidi L, Rega G (2013) Microcantilever dynamics in tapping mode atomic force microscopy via higher eigenmodes analysis. J Appl Phys 113(22):1–14CrossRef Andreaus U, Placidi L, Rega G (2013) Microcantilever dynamics in tapping mode atomic force microscopy via higher eigenmodes analysis. J Appl Phys 113(22):1–14CrossRef
Zurück zum Zitat Chuang W-C, Hu Y-C, Lee C-Y, Shih W-P, Chang P-Z (2009) Electromechanical behavior of the curled cantilever beam. J. Micro Nanolith (MEMS MOEMS) 8:033020CrossRef Chuang W-C, Hu Y-C, Lee C-Y, Shih W-P, Chang P-Z (2009) Electromechanical behavior of the curled cantilever beam. J. Micro Nanolith (MEMS MOEMS) 8:033020CrossRef
Zurück zum Zitat Fang W, Wickert JA (1996) Determining mean and gradient residual stresses in thin films using micromachined cantilevers. J Micromech Microeng 6:301–309CrossRef Fang W, Wickert JA (1996) Determining mean and gradient residual stresses in thin films using micromachined cantilevers. J Micromech Microeng 6:301–309CrossRef
Zurück zum Zitat Gupta RK (1997) Electrostatic pull-in test structure design for in situ mechanical property measurements of microelectromechanical systems, PhD Thesis, Massachusetts Institute of Technology Gupta RK (1997) Electrostatic pull-in test structure design for in situ mechanical property measurements of microelectromechanical systems, PhD Thesis, Massachusetts Institute of Technology
Zurück zum Zitat Hu Y-C (2006) Closed form solutions for the pull-in voltage of micro curled beams subjected to electrostatic loads. J Micromech Microeng 16:648–655CrossRef Hu Y-C (2006) Closed form solutions for the pull-in voltage of micro curled beams subjected to electrostatic loads. J Micromech Microeng 16:648–655CrossRef
Zurück zum Zitat Hu YC, Wei CS (2007) An analytical model considering the fringing fields for calculating the pull-in voltage of micro curled cantilever beams. J Micromech Microeng 17:61–67CrossRef Hu YC, Wei CS (2007) An analytical model considering the fringing fields for calculating the pull-in voltage of micro curled cantilever beams. J Micromech Microeng 17:61–67CrossRef
Zurück zum Zitat Legtenberg R, Gilbert J, Senturia SD (1997) Electrostatic curved electrode actuators. J Microelectromech Syst 6:257–265CrossRef Legtenberg R, Gilbert J, Senturia SD (1997) Electrostatic curved electrode actuators. J Microelectromech Syst 6:257–265CrossRef
Zurück zum Zitat Lishchynska M, Cordero N, Slattery O, O’Mahony C (2005) Modelling electrostatic behaviour of microcantilevers incorporating residual stress gradient and non-ideal anchors. J Micromech Microeng 15:S10–S14. doi:10.1088/0960-1317/15/7/002 CrossRef Lishchynska M, Cordero N, Slattery O, O’Mahony C (2005) Modelling electrostatic behaviour of microcantilevers incorporating residual stress gradient and non-ideal anchors. J Micromech Microeng 15:S10–S14. doi:10.​1088/​0960-1317/​15/​7/​002 CrossRef
Zurück zum Zitat Nayfeh AH, Younis MI, Abdel-Rahman EM (2005) Reduced-order models for MEMS applications. Nonlinear Dyn 41:211–236MathSciNetCrossRef Nayfeh AH, Younis MI, Abdel-Rahman EM (2005) Reduced-order models for MEMS applications. Nonlinear Dyn 41:211–236MathSciNetCrossRef
Zurück zum Zitat Ou K-S, Chen K-S, Yang T-S, Lee S-Y (2011) A novel semianalytical approach for finding pull-in voltages of micro cantilever beams subjected to electrostatic loads and residual stress gradients. J Microelectromech Sys 20:527–537CrossRef Ou K-S, Chen K-S, Yang T-S, Lee S-Y (2011) A novel semianalytical approach for finding pull-in voltages of micro cantilever beams subjected to electrostatic loads and residual stress gradients. J Microelectromech Sys 20:527–537CrossRef
Zurück zum Zitat Saha SC, Hanke U, Jensen GU, Saether T (2008) Modelling of spring constant and pull-down voltage of non-uniform RF MEMS cantilever incorporating stress gradient. Sens Transducers J 98:54–68 (ISSN 1726–5479) Saha SC, Hanke U, Jensen GU, Saether T (2008) Modelling of spring constant and pull-down voltage of non-uniform RF MEMS cantilever incorporating stress gradient. Sens Transducers J 98:54–68 (ISSN 1726–5479)
Zurück zum Zitat Senturia SD (2001) Microsystem design. Kluwer, Boston Senturia SD (2001) Microsystem design. Kluwer, Boston
Zurück zum Zitat Vaishali BM, Wali UV, Nandi AV (2011) Analytical model for compensating the curling effect in MEMS cantilever beam. Int J Comput Sci Issues 1:97–100 (ISSN 1694–0814) Vaishali BM, Wali UV, Nandi AV (2011) Analytical model for compensating the curling effect in MEMS cantilever beam. Int J Comput Sci Issues 1:97–100 (ISSN 1694–0814)
Zurück zum Zitat Wei LC, Mohammad AB, Kassim NM (2002) Analytical modeling for determination of pull-in voltage for an electrostatic actuated MEMS cantilever beam. In: Proceedings IEEE international conference on semiconductor electronics (Penang, Malaysia), pp 233–238 Wei LC, Mohammad AB, Kassim NM (2002) Analytical modeling for determination of pull-in voltage for an electrostatic actuated MEMS cantilever beam. In: Proceedings IEEE international conference on semiconductor electronics (Penang, Malaysia), pp 233–238
Zurück zum Zitat Younis MI (2011) MEMS linear and nonlinear statics and dynamics. Springer, New YorkCrossRef Younis MI (2011) MEMS linear and nonlinear statics and dynamics. Springer, New YorkCrossRef
Zurück zum Zitat Younis MI, Abdel-Rahman EM, Nayfeh AH (2003) A reduced-order model for electrically actuated microbeam-based MEMS. J Microelectromech Sys 12:672–680CrossRef Younis MI, Abdel-Rahman EM, Nayfeh AH (2003) A reduced-order model for electrically actuated microbeam-based MEMS. J Microelectromech Sys 12:672–680CrossRef
Zurück zum Zitat Younis MI, Miles R, Jordy D (2006) Investigation of the response of microstructures under the combined effect of mechanical shock and electrostatic forces. J Micromech Microeng 16:2463–2474CrossRef Younis MI, Miles R, Jordy D (2006) Investigation of the response of microstructures under the combined effect of mechanical shock and electrostatic forces. J Micromech Microeng 16:2463–2474CrossRef
Zurück zum Zitat Younis MI, Ouakad H, Alsaleem FM, Miles R, Cui W (2010) Nonlinear dynamics of MEMS arches under harmonic electrostatic actuation. J. Microelectromech Sys 19:647–656CrossRef Younis MI, Ouakad H, Alsaleem FM, Miles R, Cui W (2010) Nonlinear dynamics of MEMS arches under harmonic electrostatic actuation. J. Microelectromech Sys 19:647–656CrossRef
Metadaten
Titel
Analytical expressions for the electrostatically actuated curled beam problem
verfasst von
Mohammad I. Younis
Publikationsdatum
01.08.2015
Verlag
Springer Berlin Heidelberg
Erschienen in
Microsystem Technologies / Ausgabe 8/2015
Print ISSN: 0946-7076
Elektronische ISSN: 1432-1858
DOI
https://doi.org/10.1007/s00542-014-2264-y

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