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Erschienen in:
Effects of Transient Faults in Integrated Circuits Kapitel lesen Erstes Kapitel lesen

2020 | OriginalPaper | Buchkapitel

7. Automatic Integration of Body Built-In Sensors into Digital Design Flows

verfasst von : Rodrigo Possamai Bastos, Frank Sill Torres

Erschienen in: On-Chip Current Sensors for Reliable, Secure, and Low-Power Integrated Circuits

Verlag: Springer International Publishing

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Abstract

This chapter discusses aspects of the integration of Body Built-In Current Sensors (BBICS) into digital integrated circuit systems. The first challenge to be addressed is the automatic integration of the sensors in digital designs. The related flow is introduced and elaborated by means of an exemplary design. The second challenge to be addressed is the processing of the output data of BBICS on higher layers. Therefore, this chapter presents a light-weight RISC processor that is able to roll back to a secure state enabling a low-cost solution against radiation-induced transient faults.

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Vorheriges Kapitel Body Built-In Cells for Detecting Transient Faults and Adaptively Biasing Subcircuits
Nächstes Kapitel Body Built-In Sensors for Testing Integrated Circuit Systems for Hardware Trojans
Fußnoten
1
This is a very simplified summary of the back-end process. More detailed information can be found in the standard literature, like [249] or [10].
 
2
The aspect ration defines the relation between total width and length of the complete layout.
 
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Metadaten
Titel
Automatic Integration of Body Built-In Sensors into Digital Design Flows
verfasst von
Rodrigo Possamai Bastos
Frank Sill Torres
Copyright-Jahr
2020
Buch
On-Chip Current Sensors for Reliable, Secure, and Low-Power Integrated Circuits

Print ISBN: 978-3-030-29352-9

Electronic ISBN: 978-3-030-29353-6

Copyright-Jahr: 2020

DOI
https://doi.org/10.1007/978-3-030-29353-6_7

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