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Erschienen in:
01.08.2015
Enhanced ferroelectric properties of self-polarized BiFe0.86Ti0.12Zn0.02O3 thin films on tin oxide-coated glass substrates
Erschienen in: Journal of Materials Science: Materials in Electronics | Ausgabe 8/2015
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Abstract
The BiFe0.86Ti0.12Zn0.02O3 (BFTZO) thin films were successfully prepared on indium tin oxide-coated glass substrates by chemical solution deposition method. Structures, dielectric and ferroelectric properties of thin films were investigated as functions of annealing temperature. All the BFTZO thin films exhibit a varying degree of (012) diffraction peak depending on the annealing temperature. The leakage currents are considerably reduced by doping Ti4+ (12 %) with a high doping content. Moreover, all the BFTZO thin films are phase-pure, and self-polarized, which makes it promising for applications in microelectromechanical system. The film annealed at 500 °C exhibits the largest dielectric constant of 540, which make it to be a promising candidate for applications of data storage.