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Erschienen in: Journal of Electronic Testing 5/2018

24.08.2018

Exploiting Multi-Phase On-Chip Voltage Regulators as Strong PUF Primitives for Securing IoT

verfasst von: Weize Yu, Yiming Wen, Selçuk Köse, Jia Chen

Erschienen in: Journal of Electronic Testing | Ausgabe 5/2018

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Abstract

The physical randomness of the flying capacitors in the multi-phase on-chip switched-capacitor (SC) voltage converter is exploited as a novel strong physical unclonable function (PUF) primitive for IoT authentication. Moreover, for the strong PUF we devised, an approximated constant input power is achieved against side-channel attacks and a non-linear transformation block is utilized to scramble the high linear relationship between the input challenges and output responses against machine-learning attacks. The results show that the novel strong PUF primitive we designed achieves a nearly 51.3% inter-Hamming distance (HD) and 98.5% reliability while maintaining a high security level against both side-channel and machine-learning attacks.

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Fußnoten
1
As demonstrated in Fig. 3, the output voltage of an SC converter is a periodical signal. Therefore, the voltage component of \(V_{out,i,j}\) related with the timing t can be unfolded with Fourier series.
 
2
w1, \(w_{2}\), ..., \(w_{32}\) control the activation behaviors of the switches \(W_{i,1}\), Wi,2, ... \(W_{i,32}\), respectively. If \(w_{j}= 1\), the switches \(W_{1,j}\) and \(W_{2,j}\) are turned on, and vice versa.
 
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Metadaten
Titel
Exploiting Multi-Phase On-Chip Voltage Regulators as Strong PUF Primitives for Securing IoT
verfasst von
Weize Yu
Yiming Wen
Selçuk Köse
Jia Chen
Publikationsdatum
24.08.2018
Verlag
Springer US
Erschienen in
Journal of Electronic Testing / Ausgabe 5/2018
Print ISSN: 0923-8174
Elektronische ISSN: 1573-0727
DOI
https://doi.org/10.1007/s10836-018-5746-5

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