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Erschienen in:
12.11.2018
Good thermal stability and low dielectric loss of (K0.47Na0.47Li0.06)NbO3–(Bi0.5Na0.5)(Li0.25Ta0.75)O3 ceramics in a wide temperature range
Erschienen in: Journal of Materials Science: Materials in Electronics | Ausgabe 1/2019
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Abstract
(K0.47Na0.47Li0.06)NbO3–(Bi0.5Na0.5)(Li0.25Ta0.75)O3 [(1−x)KNLN–xBNLT, 0 ≤ x ≤ 0.02] ceramics were prepared via a traditional solid phase method. The phase structure of (1−x)KNLN–xBNLT ceramics was studied by X-ray diffraction and Raman spectroscopy. The relative permittivity of KNLN ceramics could be improved with adding BNLT. When x = 0.01, the ceramic exhibited large relative permittivity and good thermal stability from 70 to 375 °C (Δε/ε70°C ≤ ± 12%), indicating that this material could be applied in capacitors with wider working-temperature range. As x = 0.005, the ceramics exhibited high piezoelectric constant of 180 pC N−1 and good piezoelectric stability under 400 °C. The conductivity behavior of (1−x)KNLN–xBNLT ceramics at high temperature was also investigated, showing that the relaxation processes and mechanisms of conduction were thermal activation attributed by the double-ionized oxygen vacancy.