Skip to main content
Erschienen in: Experimental Mechanics 8/2022

07.07.2022 | Sp Iss: Advances in Residual Stress Technology

Incremental FIB-DIC Ring-Core Methods for the Residual Stress Measurement of Bilayer Thin Films

verfasst von: N.M. Dang, W.-Y. Ku, Z.-Y. Wang, C.-H. Lin, T.Y.-F. Chen, M.-T. Lin

Erschienen in: Experimental Mechanics | Ausgabe 8/2022

Einloggen

Aktivieren Sie unsere intelligente Suche, um passende Fachinhalte oder Patente zu finden.

search-config
loading …

Abstract

Background

The thin film coating and the microsystem device’s reliability can be strongly affected by residual stress; thus, accurate residual stress measurement in thin films is important.

Objective

This study conducted residual stress measurement to provide a viable semi-destructive method for evaluating the residual stress of bilayer thin film.

Methods

A model for analyzing residual stress in elastically isotropic bilayer thin film was developed by combining the usage of Focused Ion Beam—Digital Image Correlation (FIB-DIC) with finite element (FE) modeling calculated calibration coefficients. The relaxation stress of thin film can be revealed with corresponding milling depth.

Results

Residual stress results of ZrN/Zr bilayer thin films were measured with the implementation of FE analysis calibration coefficients and the resulting strain release. A comparison between the collected results with other studies was performed to prove the practicality and applicability of this method.

Conclusions

This study showed that the residual stress of each layer of the bilayer thin film corresponded to its deposition conditions. Therefore, the residual stress of the bilayer thin film could be measured using the proposed Incremental FIB-DIC ring-core method.

Sie haben noch keine Lizenz? Dann Informieren Sie sich jetzt über unsere Produkte:

Springer Professional "Wirtschaft+Technik"

Online-Abonnement

Mit Springer Professional "Wirtschaft+Technik" erhalten Sie Zugriff auf:

  • über 102.000 Bücher
  • über 537 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Maschinenbau + Werkstoffe
  • Versicherung + Risiko

Jetzt Wissensvorsprung sichern!

Springer Professional "Technik"

Online-Abonnement

Mit Springer Professional "Technik" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 390 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Maschinenbau + Werkstoffe




 

Jetzt Wissensvorsprung sichern!

Literatur
1.
Zurück zum Zitat Bemporad E, Brisotto M, Depero LE, Gelfi M, Korsunsky AM, Lunt AJG, Sebastiani M (2014) A critical comparison between XRD and FIB residual stress measurement techniques in thin films. Thin Solid Films 572:224–231CrossRef Bemporad E, Brisotto M, Depero LE, Gelfi M, Korsunsky AM, Lunt AJG, Sebastiani M (2014) A critical comparison between XRD and FIB residual stress measurement techniques in thin films. Thin Solid Films 572:224–231CrossRef
2.
Zurück zum Zitat Korsunsky AM, Sebastiani M, Bemporad E (2010) Residual stress evaluation at the micrometer scale: Analysis of thin coatings by FIB milling and digital image correlation. Surf Coat Technol 205:2393–2403CrossRef Korsunsky AM, Sebastiani M, Bemporad E (2010) Residual stress evaluation at the micrometer scale: Analysis of thin coatings by FIB milling and digital image correlation. Surf Coat Technol 205:2393–2403CrossRef
3.
Zurück zum Zitat Lunt AJG, Korsunsky AM (2015) A review of micro-scale focused ion beam milling and digital image correlation analysis for residual stress evaluation and error estimation. Surf Coat Technol 283:373–388CrossRef Lunt AJG, Korsunsky AM (2015) A review of micro-scale focused ion beam milling and digital image correlation analysis for residual stress evaluation and error estimation. Surf Coat Technol 283:373–388CrossRef
4.
Zurück zum Zitat Nervi S, Szabó BA (2007) On the estimation of residual stresses by the crack compliance method. Comput Methods Appl Mech Eng 196:3577–3584MATHCrossRef Nervi S, Szabó BA (2007) On the estimation of residual stresses by the crack compliance method. Comput Methods Appl Mech Eng 196:3577–3584MATHCrossRef
5.
Zurück zum Zitat Guo J, Fu H, Pan B, Kang R (2021) Recent progress of residual stress measurement methods: A review. Chinese J Aeronaut 34:54–78CrossRef Guo J, Fu H, Pan B, Kang R (2021) Recent progress of residual stress measurement methods: A review. Chinese J Aeronaut 34:54–78CrossRef
6.
Zurück zum Zitat Zhan Y, Liu C, Kong X, Lin Z (2017) Experiment and numerical simulation for laser ultrasonic measurement of residual stress. Ultrasonics 73:271–276CrossRef Zhan Y, Liu C, Kong X, Lin Z (2017) Experiment and numerical simulation for laser ultrasonic measurement of residual stress. Ultrasonics 73:271–276CrossRef
7.
Zurück zum Zitat Nguyen VP, Nguyen AVH, Le CC, Dang TN (2021) An Integrated Software for Computing Mechanical Properties of Crystalline Material by Means of XRD. Appl Sci 11(20):9523CrossRef Nguyen VP, Nguyen AVH, Le CC, Dang TN (2021) An Integrated Software for Computing Mechanical Properties of Crystalline Material by Means of XRD. Appl Sci 11(20):9523CrossRef
8.
Zurück zum Zitat Abuku S, Cullity BD (1971) A magnetic method for the determination of residual stress. Exp Mech 11:217–223CrossRef Abuku S, Cullity BD (1971) A magnetic method for the determination of residual stress. Exp Mech 11:217–223CrossRef
9.
Zurück zum Zitat Kang Y, Qiu Y, Lei Z, Hu M (2005) An application of Raman spectroscopy on the measurement of residual stress in porous silicon. Opt Lasers Eng 43(8):847–855CrossRef Kang Y, Qiu Y, Lei Z, Hu M (2005) An application of Raman spectroscopy on the measurement of residual stress in porous silicon. Opt Lasers Eng 43(8):847–855CrossRef
10.
Zurück zum Zitat Lee YH, Kwon D (2002) Residual stresses in DLC/Si and Au/Si systems: Application of a stress-relaxation model to the nanoindentation technique. J Mater Res 17:901–906CrossRef Lee YH, Kwon D (2002) Residual stresses in DLC/Si and Au/Si systems: Application of a stress-relaxation model to the nanoindentation technique. J Mater Res 17:901–906CrossRef
11.
Zurück zum Zitat Schajer GS (1981) Application of Finite Element Calculations to Residual Stress Measurements. J Eng Mater Technol 103(2):157–163CrossRef Schajer GS (1981) Application of Finite Element Calculations to Residual Stress Measurements. J Eng Mater Technol 103(2):157–163CrossRef
12.
Zurück zum Zitat Schajer GS, Whitehead PS (2017) Hole-Drilling Method for Measuring Residual Stresses. In: Zimmerman KB (ed) Stress Computations, 1st edn. Morgan & Claypool Publishers, San Rafael, pp 87–113 Schajer GS, Whitehead PS (2017) Hole-Drilling Method for Measuring Residual Stresses. In: Zimmerman KB (ed) Stress Computations, 1st edn. Morgan & Claypool Publishers, San Rafael, pp 87–113
13.
Zurück zum Zitat Keil S (1992) Experimental Determination of Residual Stresses With The Ring-Core Method And An On-Line Measuring System. Exp Tech 16:17–24CrossRef Keil S (1992) Experimental Determination of Residual Stresses With The Ring-Core Method And An On-Line Measuring System. Exp Tech 16:17–24CrossRef
14.
Zurück zum Zitat Ajovalasit A, Petrucci G, Zuccarello B (1996) Determination of Nonuniform Residual Stresses Using the Ring-Core Method. J Eng Mater Technol 118(2):224–228CrossRef Ajovalasit A, Petrucci G, Zuccarello B (1996) Determination of Nonuniform Residual Stresses Using the Ring-Core Method. J Eng Mater Technol 118(2):224–228CrossRef
15.
Zurück zum Zitat Zhu JG, Xie HM, Li YJ, Hu ZX, Luo Q, Gu CZ (2014) Interfacial Residual Stress Analysis of Thermal Spray Coatings by Miniature Ring-Core Cutting Combined with DIC Method. Exp Mech 54:127–136CrossRef Zhu JG, Xie HM, Li YJ, Hu ZX, Luo Q, Gu CZ (2014) Interfacial Residual Stress Analysis of Thermal Spray Coatings by Miniature Ring-Core Cutting Combined with DIC Method. Exp Mech 54:127–136CrossRef
16.
Zurück zum Zitat Hu Z, Xie H, Lu J, Zhu J, Wang H (2013) Residual stresses measurement by using ring-core method and 3D digital image correlation technique. Meas Sci Technol 24:085604CrossRef Hu Z, Xie H, Lu J, Zhu J, Wang H (2013) Residual stresses measurement by using ring-core method and 3D digital image correlation technique. Meas Sci Technol 24:085604CrossRef
17.
Zurück zum Zitat Pan B, Yu L, Wu D (2013) High-Accuracy 2D Digital Image Correlation Measurements with Bilateral Telecentric Lenses: Error Analysis and Experimental Verification. Exp Mech 53:1719–1733CrossRef Pan B, Yu L, Wu D (2013) High-Accuracy 2D Digital Image Correlation Measurements with Bilateral Telecentric Lenses: Error Analysis and Experimental Verification. Exp Mech 53:1719–1733CrossRef
18.
Zurück zum Zitat Chu TC, Ranson WF, Sutton MA (1985) Applications of digital-image-correlation techniques to experimental mechanics. Exp Mech 25:232–244CrossRef Chu TC, Ranson WF, Sutton MA (1985) Applications of digital-image-correlation techniques to experimental mechanics. Exp Mech 25:232–244CrossRef
19.
Zurück zum Zitat Sutton MA, Yan JH, Tiwari B, Schreier HW, Orteu JJ (2008) The effect of out-of-plane motion on 2D and 3D digital image correlation measurements. Opt Lasers Eng 46(10):746–757CrossRef Sutton MA, Yan JH, Tiwari B, Schreier HW, Orteu JJ (2008) The effect of out-of-plane motion on 2D and 3D digital image correlation measurements. Opt Lasers Eng 46(10):746–757CrossRef
20.
Zurück zum Zitat Massl S, Keckes J, Pippan R (2007) A direct method of determining complex depth profiles of residual stresses in thin films on a nanoscale. Acta Mater 55(14):4835–4844CrossRef Massl S, Keckes J, Pippan R (2007) A direct method of determining complex depth profiles of residual stresses in thin films on a nanoscale. Acta Mater 55(14):4835–4844CrossRef
21.
Zurück zum Zitat Winiarski B, Schajer GS, Withers PJ (2012) Surface Decoration for Improving the Accuracy of Displacement Measurements by Digital Image Correlation in SEM. Exp Mech 52:793–804CrossRef Winiarski B, Schajer GS, Withers PJ (2012) Surface Decoration for Improving the Accuracy of Displacement Measurements by Digital Image Correlation in SEM. Exp Mech 52:793–804CrossRef
22.
Zurück zum Zitat Chen TYF, Chen TC, Cheng FY, Tsai AT, Lin MT (2018) Digital image correlation of SEM images for surface deformation of CMOS IC. Microelectron Eng 201:16–21CrossRef Chen TYF, Chen TC, Cheng FY, Tsai AT, Lin MT (2018) Digital image correlation of SEM images for surface deformation of CMOS IC. Microelectron Eng 201:16–21CrossRef
23.
Zurück zum Zitat Chen TYF, Chou YC, Wang ZY, Lin WY, Lin MT (2020) Using Digital Image Correlation on SEM Images of Strain Field after Ion Beam Milling for the Residual Stress Measurement of Thin films. Materials 13(6):1291CrossRef Chen TYF, Chou YC, Wang ZY, Lin WY, Lin MT (2020) Using Digital Image Correlation on SEM Images of Strain Field after Ion Beam Milling for the Residual Stress Measurement of Thin films. Materials 13(6):1291CrossRef
24.
Zurück zum Zitat Salvati E, Romano-Brandt L, Mughal MZ, Sebastiani M, Korsunsky AM (2019) Generalised residual stress depth profiling at the nanoscale using focused ion beam milling. J Mech Phys Solids 125:488–501MathSciNetCrossRef Salvati E, Romano-Brandt L, Mughal MZ, Sebastiani M, Korsunsky AM (2019) Generalised residual stress depth profiling at the nanoscale using focused ion beam milling. J Mech Phys Solids 125:488–501MathSciNetCrossRef
25.
Zurück zum Zitat Sebastiani M, Eberl C, Bemporad E, Korsunsky AM, Nix WD, Carassiti F (2014) Focused ion beam four-slot milling for Poisson’s ratio and residual stress evaluation at the micron scale. Surf Coat Technol 251:151–161CrossRef Sebastiani M, Eberl C, Bemporad E, Korsunsky AM, Nix WD, Carassiti F (2014) Focused ion beam four-slot milling for Poisson’s ratio and residual stress evaluation at the micron scale. Surf Coat Technol 251:151–161CrossRef
26.
Zurück zum Zitat Korsunsky AM, Sebastiani M, Bemporad E (2009) Focused ion beam ring drilling for residual stress evaluation. Mater Lett 63(22):1961–1963CrossRef Korsunsky AM, Sebastiani M, Bemporad E (2009) Focused ion beam ring drilling for residual stress evaluation. Mater Lett 63(22):1961–1963CrossRef
27.
Zurück zum Zitat Sebastiani M, Eberl C, Bemporad E, Pharr GM (2011) Depth-resolved residual stress analysis of thin coatings by a new FIB–DIC method. Mater Sci Eng A 528(27):7901–7908CrossRef Sebastiani M, Eberl C, Bemporad E, Pharr GM (2011) Depth-resolved residual stress analysis of thin coatings by a new FIB–DIC method. Mater Sci Eng A 528(27):7901–7908CrossRef
28.
Zurück zum Zitat Sutton MA, Wolters WJ, Peters WH, Ranson WF, McNeill SR (1983) Determination of displacements using an improved digital correlation method. Image Vis Comput 1(3):133–139CrossRef Sutton MA, Wolters WJ, Peters WH, Ranson WF, McNeill SR (1983) Determination of displacements using an improved digital correlation method. Image Vis Comput 1(3):133–139CrossRef
29.
Zurück zum Zitat Sutton MA, McNeill SR, Jang j, Babai M, (1988) Effects of Subpixel Image Restoration On Digital Correlation Error Estimates. Opt Eng 27(10):271–70CrossRef Sutton MA, McNeill SR, Jang j, Babai M, (1988) Effects of Subpixel Image Restoration On Digital Correlation Error Estimates. Opt Eng 27(10):271–70CrossRef
30.
Zurück zum Zitat Sutton MA, Mingqi C, Peters WH, Chao YJ, McNeill SR (1986) Application of an optimized digital correlation method to planar deformation analysis. Image Vis Comput 4(3):143–150CrossRef Sutton MA, Mingqi C, Peters WH, Chao YJ, McNeill SR (1986) Application of an optimized digital correlation method to planar deformation analysis. Image Vis Comput 4(3):143–150CrossRef
31.
Zurück zum Zitat Babaeeian M, Mohammadimehr M (2020) Investigation of the time elapsed effect on residual stress measurement in a composite plate by DIC method. Opt Lasers Eng 128:106002CrossRef Babaeeian M, Mohammadimehr M (2020) Investigation of the time elapsed effect on residual stress measurement in a composite plate by DIC method. Opt Lasers Eng 128:106002CrossRef
32.
Zurück zum Zitat Ma CH, Huang JH, Chen H (2002) Residual stress measurement in textured thin film by grazing-incidence X-ray diffraction. Thin Solid Films 418(2):73–78CrossRef Ma CH, Huang JH, Chen H (2002) Residual stress measurement in textured thin film by grazing-incidence X-ray diffraction. Thin Solid Films 418(2):73–78CrossRef
33.
Zurück zum Zitat Guo CQ, Pei ZL, Fan D, Liu RD, Gong J, Sun C (2016) Predicting multilayer film’s residual stress from its monolayers. Mater Des 110:858–864CrossRef Guo CQ, Pei ZL, Fan D, Liu RD, Gong J, Sun C (2016) Predicting multilayer film’s residual stress from its monolayers. Mater Des 110:858–864CrossRef
34.
Zurück zum Zitat Chen TYF, Dang NM, Wang ZY, Chang LW, Ku WY, Lo YL, Lin MT (2021) Use of Digital Image Correlation Method to Measure Bio-Tissue Deformation. Coatings 11(8):924CrossRef Chen TYF, Dang NM, Wang ZY, Chang LW, Ku WY, Lo YL, Lin MT (2021) Use of Digital Image Correlation Method to Measure Bio-Tissue Deformation. Coatings 11(8):924CrossRef
35.
Zurück zum Zitat Peters WH, Ranson WF (1982) Digital imaging technique in experimental mechanics. Opt Eng 21(3):427–431CrossRef Peters WH, Ranson WF (1982) Digital imaging technique in experimental mechanics. Opt Eng 21(3):427–431CrossRef
36.
Zurück zum Zitat Bruck HA, McNeill SR, Sutton MA, Peters WH (1989) Digital image correlation using Newton-Raphson method of partial differential correction. Exp Mech 29:261–267CrossRef Bruck HA, McNeill SR, Sutton MA, Peters WH (1989) Digital image correlation using Newton-Raphson method of partial differential correction. Exp Mech 29:261–267CrossRef
37.
Zurück zum Zitat Sutton MA, Li N, Joy DC, Reynolds AP, Li X (2007) Scanning Electron Microscopy for Quantitative Small and Large Deformation Measurements Part I: SEM Imaging at Magnifications from 200 to 10,000. Exp Mech 47:775–787CrossRef Sutton MA, Li N, Joy DC, Reynolds AP, Li X (2007) Scanning Electron Microscopy for Quantitative Small and Large Deformation Measurements Part I: SEM Imaging at Magnifications from 200 to 10,000. Exp Mech 47:775–787CrossRef
38.
Zurück zum Zitat Sutton MA, Li N, Garcia D, Cornille N, Orteu JJ, McNeill SR, Schreier HW, Li X, Reynolds AP (2007) Scanning Electron Microscopy for Quantitative Small and Large Deformation Measurements Part II: Experimental Validation for Magnifications from 200 to 10,000. Exp Mech 47:789–804CrossRef Sutton MA, Li N, Garcia D, Cornille N, Orteu JJ, McNeill SR, Schreier HW, Li X, Reynolds AP (2007) Scanning Electron Microscopy for Quantitative Small and Large Deformation Measurements Part II: Experimental Validation for Magnifications from 200 to 10,000. Exp Mech 47:789–804CrossRef
39.
Zurück zum Zitat Mello AW, Book TA, Nicolas A, Gilpin CJ, Sangid MD (2017) Distortion Correction Protocol for Digital Image Correlation after Scanning Electron Microscopy: Emphasis on Long Duration and Ex-Situ Experiments. Exp Mech 57:1395–1409CrossRef Mello AW, Book TA, Nicolas A, Gilpin CJ, Sangid MD (2017) Distortion Correction Protocol for Digital Image Correlation after Scanning Electron Microscopy: Emphasis on Long Duration and Ex-Situ Experiments. Exp Mech 57:1395–1409CrossRef
40.
Zurück zum Zitat Zuccarello B (1996) Optimization of depth increment distribution in the ring-core method. J Strain Anal Eng Des 31(4):251–258CrossRef Zuccarello B (1996) Optimization of depth increment distribution in the ring-core method. J Strain Anal Eng Des 31(4):251–258CrossRef
41.
Zurück zum Zitat Standard E837–08 (2008) Determining residual stresses by the hole-drilling strain-gage method. Am Society Test Mater (ASTM) Standard E837–08 (2008) Determining residual stresses by the hole-drilling strain-gage method. Am Society Test Mater (ASTM)
42.
Zurück zum Zitat Aoh J, Wei C (2002) On the Improvement of Calibration Coefficients for Hole-Drilling Integral Method: Part I—Analysis of Calibration Coefficients Obtained by a 3-D FEM Model. J Eng Mater Technol 124(2):250–258CrossRef Aoh J, Wei C (2002) On the Improvement of Calibration Coefficients for Hole-Drilling Integral Method: Part I—Analysis of Calibration Coefficients Obtained by a 3-D FEM Model. J Eng Mater Technol 124(2):250–258CrossRef
43.
Zurück zum Zitat Beghini M, Bertini L, Giri A, Santus C, Valentini E (2019) Measuring residual stress in finite thickness plates using the hole-drilling method. J Strain Anal Eng Des 54(1):65–75CrossRef Beghini M, Bertini L, Giri A, Santus C, Valentini E (2019) Measuring residual stress in finite thickness plates using the hole-drilling method. J Strain Anal Eng Des 54(1):65–75CrossRef
44.
Zurück zum Zitat Alegre JM, Díaz A, Cuesta II, Manso JM (2019) Analysis of the Influence of the Thickness and the Hole Radius on the Calibration Coefficients in the Hole-Drilling Method for the Determination of Non-Uniform Residual Stresses. Exp Mech 59:79–94CrossRef Alegre JM, Díaz A, Cuesta II, Manso JM (2019) Analysis of the Influence of the Thickness and the Hole Radius on the Calibration Coefficients in the Hole-Drilling Method for the Determination of Non-Uniform Residual Stresses. Exp Mech 59:79–94CrossRef
45.
Zurück zum Zitat Schuster S, Steinzig M, Gibmeier J (2017) Incremental Hole Drilling for Residual Stress Analysis of Thin Walled Components with Regard to Plasticity Effects. Exp Mech 57:1457–1467CrossRef Schuster S, Steinzig M, Gibmeier J (2017) Incremental Hole Drilling for Residual Stress Analysis of Thin Walled Components with Regard to Plasticity Effects. Exp Mech 57:1457–1467CrossRef
46.
Zurück zum Zitat Perry AJ (1990) A contribution to the study of poisson’s ratios and elasticconstants of TiN. ZrN and HfN Thin Solid Films 193–194(1):463–471CrossRef Perry AJ (1990) A contribution to the study of poisson’s ratios and elasticconstants of TiN. ZrN and HfN Thin Solid Films 193–194(1):463–471CrossRef
48.
Zurück zum Zitat Song X, Yeap KB, Zhu J, Belnoue J, Sebastiani M, Bemporad E, Zeng K, Korsunsky AM (2012) Residual stress measurement in thin films at sub-micron scale using Focused Ion Beam milling and imaging. Thin Solid Films 520(6):2073–2076CrossRef Song X, Yeap KB, Zhu J, Belnoue J, Sebastiani M, Bemporad E, Zeng K, Korsunsky AM (2012) Residual stress measurement in thin films at sub-micron scale using Focused Ion Beam milling and imaging. Thin Solid Films 520(6):2073–2076CrossRef
49.
Zurück zum Zitat Ali R, Renzelli M, Khan MI, Sebastiani M, Bemporad E (2018) Effects of Residual Stress Distribution on Interfacial Adhesion of Magnetron Sputtered AlN and AlN/Al Nanostructured Coatings on a (100) Silicon Substrate. Nanomaterials 8(11):896CrossRef Ali R, Renzelli M, Khan MI, Sebastiani M, Bemporad E (2018) Effects of Residual Stress Distribution on Interfacial Adhesion of Magnetron Sputtered AlN and AlN/Al Nanostructured Coatings on a (100) Silicon Substrate. Nanomaterials 8(11):896CrossRef
Metadaten
Titel
Incremental FIB-DIC Ring-Core Methods for the Residual Stress Measurement of Bilayer Thin Films
verfasst von
N.M. Dang
W.-Y. Ku
Z.-Y. Wang
C.-H. Lin
T.Y.-F. Chen
M.-T. Lin
Publikationsdatum
07.07.2022
Verlag
Springer US
Erschienen in
Experimental Mechanics / Ausgabe 8/2022
Print ISSN: 0014-4851
Elektronische ISSN: 1741-2765
DOI
https://doi.org/10.1007/s11340-022-00877-z

Weitere Artikel der Ausgabe 8/2022

Experimental Mechanics 8/2022 Zur Ausgabe

    Marktübersichten

    Die im Laufe eines Jahres in der „adhäsion“ veröffentlichten Marktübersichten helfen Anwendern verschiedenster Branchen, sich einen gezielten Überblick über Lieferantenangebote zu verschaffen.