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Erschienen in:
01.11.2009
Influence of minor Bi additions on the interfacial morphology between Sn–Zn–xBi solders and a Cu layer
Erschienen in: Journal of Materials Science: Materials in Electronics | Ausgabe 11/2009
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Abstract
The influence of minor Bi additions on the interfacial morphology between Sn–Zn–xBi (x = 0, 1, 3) solders and a Cu layer after reflowing were investigated by microstructural observations. The addition of minor amount of Bi into Sn–Zn solder reduced the tendency to form cracks at the solder/Cu interface. This is because alloying with Bi reduced the mismatch of the coefficient of thermal expansion (CTE) between the solder alloys and the Cu plate. Moreover, the Sn–Zn solder with Bi reduced the melting temperature of the solder alloy, and, this resulted in the coarsening of the gains and thickening of the intermetallic compound (IMC) layers because solder alloys with a lower melting temperature experienced a longer molten period during reflow. Because the Bi atoms accumulated at the surface of the IMC layers in homogeneously, partially impeding the IMC dissolving into the molten solder, a serrated-like Cu–Zn–Sn IMC layer was formed at the Sn–8Zn–3Bi/Cu interface.