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Erschienen in: Journal of Materials Science: Materials in Electronics 10/2014

01.10.2014

Investigation on the intermetallic compound layer growth of SnZnGa/SnZnGaNd solder joints

verfasst von: Peng Xue, Song-bai Xue, Yi-fu Shen, Fei Long, Hong Zhu

Erschienen in: Journal of Materials Science: Materials in Electronics | Ausgabe 10/2014

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Abstract

Growth kinetics of intermetallic compound layers (IMCs) formed between SnZnGa/SnZnGaNd solders for re-flow soldering and Cu substrate during aging was investigated at temperatures between 100 and 150 °C. The Cu5Zn8 IMCs could be found by reacting SnZnGa/SnZnGaNd solders on Cu substrate, and it was found that the addition of rare earth Nd can decrease the thickness of the IMCs of SnZn/Cu solder joints. The apparent activation energies of Cu5Zn8 which were calculated as 48.76 kJ/mol (SnZnGa) and 56.99 kJ/mol (SnZnGaNd). The shear force of Sn9Zn0.5Ga0.08Nd solder joint after aging treatment was remarkably higher than those of Sn–9Zn and Sn9Zn0.5Ga solder joints. The results would provide support to the superiority of Sn9ZnGaNd solder which can be used in the electronic packaging instead of traditional SnPb solder.

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Metadaten
Titel
Investigation on the intermetallic compound layer growth of SnZnGa/SnZnGaNd solder joints
verfasst von
Peng Xue
Song-bai Xue
Yi-fu Shen
Fei Long
Hong Zhu
Publikationsdatum
01.10.2014
Verlag
Springer US
Erschienen in
Journal of Materials Science: Materials in Electronics / Ausgabe 10/2014
Print ISSN: 0957-4522
Elektronische ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-014-2152-3

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