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Journal of Electronic Materials

Ausgabe 8/2008

Inhalt (19 Artikel)

Overshoot Graded Layers for Mismatched Heteroepitaxial Devices

J.F. Ocampo, E. Suarez, F.C. Jain, J.E. Ayers

Optical Properties of Nanocrystalline GaN Films Prepared by Annealing Amorphous GaN in Ammonia

Z.X. Zhang, X.J. Pan, T. Wang, L. Jia, L.X. Liu, W.B. Wang, E.Q. Xie

MOCVD Growth of InN on Si(111) with Various Buffer Layers

C.C. Huang, R.W. Chuang, S.J. Chang, J.C. Lin, Y.C. Cheng, W.J. Lin

Polarity Analysis of Self-Seeded Aluminum Nitride Crystals Grown by Sublimation

Qifeng Han, Chenghong Duan, Changjian Ji, Kai Qiu, Fei Zhong, Xinhua Li, Zhijun Yin, Xiancun Cao, Xiuju Zhou, Yuqi Wang

Characterization of Mg-Doped AlInN Annealed in Nitrogen and Oxygen Ambients

A.T. Cheng, Y.K. Su, W.C. Lai, Y.Z. Chen, S.Y. Kuo

Growth of GaN Nanowires on Epitaxial GaN

D. Aurongzeb, D.Y. Song, G. Kipshidze, B. Yavich, L. Nyakiti, R. Lee, J. Chaudhuri, H. Temkin, M. Holtz

Field-Emission Performance of Wormhole-Like Mesoporous Tungsten Oxide Nanowires

Wei Hao Lai, Min Hsiung Hon, Lay Gaik Teoh, Yen Hsun Su, Jiann Shieh, Chu Kun Chen

Intermetallics Characterization of Lead-Free Solder Joints under Isothermal Aging

Anupam Choubey, Hao Yu, Michael Osterman, Michael Pecht, Fu Yun, Li Yonghong, Xu Ming

Characterization of Self-Formed Ti-Rich Interface Layers in Cu(Ti)/Low-k Samples

Kazuyuki Kohama, Kazuhiro Ito, Susumu Tsukimoto, Kenichi Mori, Kazuyoshi Maekawa, Masanori Murakami

Evaluation of Mn Uniformity in CdMnTe Crystal Grown by the Vertical Bridgman Method

Jijun Zhang, Wanqi Jie, Lijun Luan, Tao Wang, Dongmei Zeng

Erratum

Ambient Temperature Ultrasonic Bonding of Si-Dice Using Sn-3.5wt.%Ag

Jung-Mo Kim, Jae-Pil Jung, Y. Norman Zhou, Jong-Hyeong Kim

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