Ausgabe 5/2000
Inhalt (13 Artikel)
Electrical and optical characterization of regrown PHEMT layer structures on etched GaAs surfaces
B. Sathya, K. Radhakrishnan, H. Q. Zheng, K. Yuan, G. I. Ng, S. F. Yoon
Conductive and transparent ZnO:Al thin films obtained by chemical spray
M. de la L. Olvera, A. Maldonado, R. Asomoza, R. Castanedo-Pe´rez, G. Torres-Delgado, J. Can~etas-Ortega
Direct silver bonding – an alternative for substrates in power semiconductor packaging
C. Chr. Schu¨ler, A. Stuck, N. Beck, H. Keser, U. Ta¨ck
EPR and magnetic susceptibility studies on V2 O5-P2O5-PbO glasses
I. Ardelean, O. Cozar, Gh. Ilonca, V. Simon, V. Mih, C. Craciun, S. Simon
Chemical solution method for fabrication of nanocrystalline iron(III) oxide thin films
Biljana Pejova, Metodija Najdoski, Ivan Grozdanov, Ardijana Isahi
Porosity development of RuO2 filled glass thick films on aluminum nitride substrates at elevated temperatures
Wenjea J. Tseng, Chir-Jang Tsai, Shen-Li Fu
Dielectric properties of sintered materials prepared from glass-ZrO2-SrTiO3 mixtures
Koichiro Tsuzuku, Seiichi Taruta, Nobuo Takusagawa, Hiroshi Kishi
Influence of poling conditions on the piezoelectric properties of PZT ceramics
Yamakawa Takahiro, Kataoka Masako, Sashida Norikazu
Monitoring the effects of storage on the rheological properties of solder paste
T. A. Nguty, N. N. Ekere
Annealing effects on electrical characteristics of 100 MeV 28Si implantation in GaAs
A. M. Narsale, A. R. Damle, Yousuf P. Ali, D. Kanjilal, B. M. Arora, A. P. Shah, S. G. Lokhre, V. P. Salvi