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Erschienen in: Microsystem Technologies 3/2011

01.03.2011 | Technical Paper

Auto-calibration of capacitive MEMS accelerometers based on pull-in voltage

verfasst von: L. A. Rocha, R. A. Dias, E. Cretu, L. Mol, R. F. Wolffenbuttel

Erschienen in: Microsystem Technologies | Ausgabe 3/2011

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Abstract

This paper describes an electro-mechanical auto-calibration technique for use in capacitive MEMS accelerometers. Auto-calibration is achieved using the combined information derived from an initial measurement of the resonance frequency and the measurement of the pull-in voltages during device operation, with an estimation of process-induced variations in device dimensions from layout and deviations in material properties from the known nominal value. An experiment-based analytical model is used to compute the required electrostatic forces required to simulate external accelerations allowing the electro-mechanical calibration of the accelerometer. Measurements on fabricated devices confirm the validity of the proposed technique and electro-mechanical calibration is experimentally demonstrated.

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Metadaten
Titel
Auto-calibration of capacitive MEMS accelerometers based on pull-in voltage
verfasst von
L. A. Rocha
R. A. Dias
E. Cretu
L. Mol
R. F. Wolffenbuttel
Publikationsdatum
01.03.2011
Verlag
Springer-Verlag
Erschienen in
Microsystem Technologies / Ausgabe 3/2011
Print ISSN: 0946-7076
Elektronische ISSN: 1432-1858
DOI
https://doi.org/10.1007/s00542-011-1252-8

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