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Erschienen in: Microsystem Technologies 10-11/2014

01.10.2014 | Technical Paper

Microstructuring of non-conductive silicon carbide by electrical discharge machining

verfasst von: Florian Zeller, Tim Hösel, Claas Müller, Holger Reinecke

Erschienen in: Microsystem Technologies | Ausgabe 10-11/2014

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Abstract

The electrical discharge machining process is an established process for machining materials regardless of their mechanical properties. Thus this process is especially attractive for materials which are hard to machine with conventional machining methods. The only requirement a material has to fulfil is having a certain electrical conductivity. Ceramic materials, (e.g. zirconia, silicon nitride or silicon carbide) exhibit excellent mechanical properties but are mostly electrically non-conductive. This can be compensated by an applied, electrically conductive assisting electrode. With this modification, the electrical discharge machining of non-conductive ceramic material is enabled. In this study the micro electrical discharge machining of non-conductive sintered silicon carbide is investigated. The drilling process shows instabilities due to the excessive generation of carbon products. A stabilisation of the process up to the maximum depth of 420 μm is realized by two approaches: adapting process parameters and adapting the tool electrode geometry. An analysis of the amount of infeed used in a milling process shows that an infeed of 15 μm has the best material removal rate to tool wear rate ratio. A maximum material removal rate of 3.58 × 10−3 mm3/min is achieved. Detached microstructures with an aspect ratio of 30 are machined. A conducted surface analysis indicates that the present removal mechanism is thermally induced spalling. Furthermore no heat affected zone is present in the machined near-surface area.

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Literatur
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Metadaten
Titel
Microstructuring of non-conductive silicon carbide by electrical discharge machining
verfasst von
Florian Zeller
Tim Hösel
Claas Müller
Holger Reinecke
Publikationsdatum
01.10.2014
Verlag
Springer Berlin Heidelberg
Erschienen in
Microsystem Technologies / Ausgabe 10-11/2014
Print ISSN: 0946-7076
Elektronische ISSN: 1432-1858
DOI
https://doi.org/10.1007/s00542-013-1965-y

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