Skip to main content
Erschienen in: Microsystem Technologies 9/2015

01.09.2015 | Technical Paper

RF-MEMS packaging by using quartz caps and epoxy polymers

verfasst von: Flavio Giacomozzi, Viviana Mulloni, Sabrina Colpo, Alessandro Faes, Guido Sordo, Stefano Girardi

Erschienen in: Microsystem Technologies | Ausgabe 9/2015

Einloggen

Aktivieren Sie unsere intelligente Suche, um passende Fachinhalte oder Patente zu finden.

search-config
loading …

Abstract

This work reports on RF MEMS chip capping to protect sensitive devices by quartz caps having a cavity to enclose MEMS devices and an epoxy film polymer as a sealing ring. Full hermeticity is not possible due to the permeability of polymer but the goal to protect the mobile parts of the devices during dicing and assembling was achieved. Good RF MEMS devices are produced by die-to-die bonding and a reliable fabrication process is defined while wafer-to-wafer process still needs improvement to increase the fabrication yield. In this paper the fabrication process for both die-to-die and wafer-to-wafer 0-level capping is presented. Good adhesion of caps to the substrate is demonstrated by shear tests, while RF measurements on CPW lines indicate a negligible insertion loss increase. Capping of both capacitive and ohmic contact switches is reported showing no loss of functionality but a modification of actuation voltage induced by thermal treatment.

Sie haben noch keine Lizenz? Dann Informieren Sie sich jetzt über unsere Produkte:

Springer Professional "Wirtschaft+Technik"

Online-Abonnement

Mit Springer Professional "Wirtschaft+Technik" erhalten Sie Zugriff auf:

  • über 102.000 Bücher
  • über 537 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Maschinenbau + Werkstoffe
  • Versicherung + Risiko

Jetzt Wissensvorsprung sichern!

Springer Professional "Technik"

Online-Abonnement

Mit Springer Professional "Technik" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 390 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Maschinenbau + Werkstoffe




 

Jetzt Wissensvorsprung sichern!

Literatur
Zurück zum Zitat Baumgartner T, Hauck K, Topper M et al (2010) Dry film photo resists and polymers—the low cost option for standard and 3-D wafer level packaging. In: 11th International Conference on Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), Xi’an, China, 16–19 Aug, 2010, pp 50–54 Baumgartner T, Hauck K, Topper M et al (2010) Dry film photo resists and polymers—the low cost option for standard and 3-D wafer level packaging. In: 11th International Conference on Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), Xi’an, China, 16–19 Aug, 2010, pp 50–54
Zurück zum Zitat Giacomozzi F, Mulloni V, Colpo S, Iannacci J, Margesin B, Faes A (2011) A flexible fabrication process for RF-MEMS devices. Romanian J Inf Sci Technol 14(3):259–268 Giacomozzi F, Mulloni V, Colpo S, Iannacci J, Margesin B, Faes A (2011) A flexible fabrication process for RF-MEMS devices. Romanian J Inf Sci Technol 14(3):259–268
Zurück zum Zitat Jourdain A, De Moor P, Baert K, DeWolf I, Tilmans HAC (2005) Mechanical and electrical characterization of BCB as a bond and seal material for cavities housing (RF-) MEMS devices. J Micromech Microeng 15(2005):S89–S96. doi:10.1088/0960-1317/15/7/013 CrossRef Jourdain A, De Moor P, Baert K, DeWolf I, Tilmans HAC (2005) Mechanical and electrical characterization of BCB as a bond and seal material for cavities housing (RF-) MEMS devices. J Micromech Microeng 15(2005):S89–S96. doi:10.​1088/​0960-1317/​15/​7/​013 CrossRef
Zurück zum Zitat Kim J, Seok S, Sharma P, Rolland N, Rolland PA (2011) Low loss zero-level packaging for high frequency RF applications by using PerMX dry film photoresist. In: 41st European Microwave Conference, Manchester, 10–13 Oct 2011 Kim J, Seok S, Sharma P, Rolland N, Rolland PA (2011) Low loss zero-level packaging for high frequency RF applications by using PerMX dry film photoresist. In: 41st European Microwave Conference, Manchester, 10–13 Oct 2011
Zurück zum Zitat Niklaus F, Stemme G, Lu JQ, Gutmann RJ (2006) Adhesive wafer bonding. J Appl Phys 99:031101CrossRef Niklaus F, Stemme G, Lu JQ, Gutmann RJ (2006) Adhesive wafer bonding. J Appl Phys 99:031101CrossRef
Zurück zum Zitat Rebeiz GM (2003) RF MEMS: theory, design, and technology. Wiley, HobokenCrossRef Rebeiz GM (2003) RF MEMS: theory, design, and technology. Wiley, HobokenCrossRef
Zurück zum Zitat Tilmans HAC (2002) MEMS components for wireless communications. In: 16th European Conference on Solid-State Transducers EUROSENSORS, 15–18 Sept, 2002, Prague Tilmans HAC (2002) MEMS components for wireless communications. In: 16th European Conference on Solid-State Transducers EUROSENSORS, 15–18 Sept, 2002, Prague
Zurück zum Zitat Töpper M, Fischer T, Baumgartner T, Reichl H (2010) A comparison of thin film polymers for wafer level packaging. In: Proceedings of 60th electronic components and technology conference (ECTC), Las Vegas, NV, USA 1–4 June 2010, pp 769–776 Töpper M, Fischer T, Baumgartner T, Reichl H (2010) A comparison of thin film polymers for wafer level packaging. In: Proceedings of 60th electronic components and technology conference (ECTC), Las Vegas, NV, USA 1–4 June 2010, pp 769–776
Zurück zum Zitat Zine-El-Abidine I, Okoniewski M (2009) A low-temperature SU-8 based wafer-level hermetic packaging for MEMS devices. IEEE Trans Adv Packag 32(2):448–452CrossRef Zine-El-Abidine I, Okoniewski M (2009) A low-temperature SU-8 based wafer-level hermetic packaging for MEMS devices. IEEE Trans Adv Packag 32(2):448–452CrossRef
Metadaten
Titel
RF-MEMS packaging by using quartz caps and epoxy polymers
verfasst von
Flavio Giacomozzi
Viviana Mulloni
Sabrina Colpo
Alessandro Faes
Guido Sordo
Stefano Girardi
Publikationsdatum
01.09.2015
Verlag
Springer Berlin Heidelberg
Erschienen in
Microsystem Technologies / Ausgabe 9/2015
Print ISSN: 0946-7076
Elektronische ISSN: 1432-1858
DOI
https://doi.org/10.1007/s00542-014-2256-y

Weitere Artikel der Ausgabe 9/2015

Microsystem Technologies 9/2015 Zur Ausgabe

Neuer Inhalt