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Journal of Materials Science: Materials in Electronics

Erschienen in:

23.01.2021

Influence of La₂O₃ content on the structural, mechanical, and radiation-shielding properties of sodium fluoro lead barium borate glasses

verfasst von: A. F. Abd El-Rehim, Kh. S. Shaaban

Erschienen in: Journal of Materials Science: Materials in Electronics | Ausgabe 4/2021

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Abstract

The techniques of melt-quenching were used to manufacture 53B₂O₃–2NaF–27PbO–\((20-x)\) BaO–\(x\) La₂O₃ \((0\le x \ge 15)\) glass system. To check the status of these samples, the XRD diffractometer procedure was used. The molar volume of the glass system is decreased while density is increased. The current glass sample's mechanical properties depend on the glass structure. Ultrasonic velocity and elastic modulus (experimental and theoretical) of glass samples were observed to be increased. FT-IR analysis shows that with the increase of La₂O₃ increases the changes of BO₃ to BO₄ and increases the degree of glass connectivity and the structural units of (BO₃/₂ F)⁻ tetrahedra are formed. It has been noted that the MAC values of glass samples are decreased to 1 meV, apart from a small increase at 0.1 meV. At low energy, this significant decline and small peak are directly linked to the current photoelectric effect. The sample with the highest La₂O₃ content is owned the MAC's greatest values. It has been noted that the (HVL) and (TVL) increase with the increase in the photon energy and La₂O₃ content rendering to the achieved results. It has been noted that the Z_eff has the largest values at lower energy and at lowering concentration of La₂O₃ content. It has been noted that EABFs and EBFs have originally lower values at low energy levels, because the photoelectric effect dominates and BaO is replaced by La₂O₃.

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Titel: Influence of La2O3 content on the structural, mechanical, and radiation-shielding properties of sodium fluoro lead barium borate glasses
verfasst von: A. F. Abd El-Rehim
Kh. S. Shaaban
Publikationsdatum: 23.01.2021
Verlag: Springer US
Erschienen in: Journal of Materials Science: Materials in Electronics / Ausgabe 4/2021
Print ISSN: 0957-4522
Elektronische ISSN: 1573-482X
DOI: https://doi.org/10.1007/s10854-020-05204-7

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