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Erschienen in: Journal of Electronic Testing 6/2016

08.11.2016

Mahalanobis Distance Based Approach for Anomaly Detection of Analog Filters Using Frequency Features and Parzen Window Density Estimation

verfasst von: Zewen Hu, Mingqing Xiao, Lei Zhang, Shuai Liu, Yawei Ge

Erschienen in: Journal of Electronic Testing | Ausgabe 6/2016

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Abstract

Analog filters play a very important role in insuring the availability of electronic systems. Early detection of anomalies of analog filters can prevent the impending failures and enhance reliability. The complex architecture and the tolerances of multiple components make it very difficult to detect anomalies in analog filters. To address this concern, A Mahalanobis distance (MD) based anomaly detection method for analog filters is proposed in this paper. The conventional frequency features and the moment of frequency response are selected as the feature vector. Mahalanobis distance is used to transform the frequency feature vector to one dimensional MD data. The anomaly detection threshold is obtained based on probability density of the health MD data sets which is estimated by Parzen window density estimation method. The efficiency of the proposed method has been verified by two case studies. In the case studies, a comprehensive indicator constructed by miss alarm and false alarm is used to obtain an optimal anomaly detection threshold. One class SVM (OCSVM) based anomaly detection method is used as a comparison with our approach. The results illustrate that: (1) the proposed frequency features can effectively clarify the degradation of analog filters; (2) the proposed MD based approach can detect anomalies in analog filters effectively at an early time stage. (3) the proposed MD based approach can detect anomalies in analog filters more accurately than OCSVM based method.

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Literatur
1.
Zurück zum Zitat Aminian M, Aminian F (2001) Fault diagnosis of nonlinear analog circuits using neural networks with wavelet and Fourier transforms as preprocessors. Journal of Electron Test: Theory Appl 17:471–481CrossRef Aminian M, Aminian F (2001) Fault diagnosis of nonlinear analog circuits using neural networks with wavelet and Fourier transforms as preprocessors. Journal of Electron Test: Theory Appl 17:471–481CrossRef
2.
Zurück zum Zitat Aminian M, Aminian F (2002) Analog fault diagnostics of actual circuits using neural networks. IEEE Trans Instrum Meas 51(3):544–550CrossRef Aminian M, Aminian F (2002) Analog fault diagnostics of actual circuits using neural networks. IEEE Trans Instrum Meas 51(3):544–550CrossRef
3.
Zurück zum Zitat Cheng S, Tom K, Pecht M (2012) Anomaly detection of polymer resettable circuit protection devices. IEEE Trans Device Mater Reliab 12(2):420–427CrossRef Cheng S, Tom K, Pecht M (2012) Anomaly detection of polymer resettable circuit protection devices. IEEE Trans Device Mater Reliab 12(2):420–427CrossRef
4.
Zurück zum Zitat Dorj E, Chen C, Pecht M (2013) A Bayesian Hidden Markov Model-Based Approach for Anomaly Detection in Electronic Systems. Proceedings of IEEE Aerospace Conference. doi:10.1109/AERO.2013.6497204 Dorj E, Chen C, Pecht M (2013) A Bayesian Hidden Markov Model-Based Approach for Anomaly Detection in Electronic Systems. Proceedings of IEEE Aerospace Conference. doi:10.​1109/​AERO.​2013.​6497204
5.
Zurück zum Zitat Fan J, Yung K, Pecht M (2012) Anomaly Detection for Chromaticity Shift of High Power White LED with Mahalanobis Distance approach. 2012 14th International Conference on Electronic & Packaging. doi:10.1109/EMAP.2012.6507916 Fan J, Yung K, Pecht M (2012) Anomaly Detection for Chromaticity Shift of High Power White LED with Mahalanobis Distance approach. 2012 14th International Conference on Electronic & Packaging. doi:10.​1109/​EMAP.​2012.​6507916
6.
Zurück zum Zitat He Y, Tan Y, Sun Y (2004) Wavelet neural network approach for fault diagnosis of analog circuits. Analogue and Mixed-Signal Test for System on Chip. doi:10.1049/ip-cds:20040495 He Y, Tan Y, Sun Y (2004) Wavelet neural network approach for fault diagnosis of analog circuits. Analogue and Mixed-Signal Test for System on Chip. doi:10.​1049/​ip-cds:​20040495
7.
Zurück zum Zitat Kumar S, Nikhil M, Dolev E, Pecht M (2012) A health indicator method for degradation detection of electronic products. Microelectron Reliab 52:439–445CrossRef Kumar S, Nikhil M, Dolev E, Pecht M (2012) A health indicator method for degradation detection of electronic products. Microelectron Reliab 52:439–445CrossRef
8.
Zurück zum Zitat Kumar S, Tommy W, Pecht M (2010) Approach to fault identification for electronic products using Mahalanobis distance. IEEE Trans Instrum Meas 59(8):2055–2064CrossRef Kumar S, Tommy W, Pecht M (2010) Approach to fault identification for electronic products using Mahalanobis distance. IEEE Trans Instrum Meas 59(8):2055–2064CrossRef
10.
Zurück zum Zitat Long B, Tian S, Wang H (2012) Diagnostics of filtered analog circuits with tolerance based on LS-SVM Using frequency features. J Electron Test: Theory Appl. doi:10.1007/s10836-011-5275-y Long B, Tian S, Wang H (2012) Diagnostics of filtered analog circuits with tolerance based on LS-SVM Using frequency features. J Electron Test: Theory Appl. doi:10.​1007/​s10836-011-5275-y
11.
Zurück zum Zitat Long B, Xian W, Li M, Wang H (2014) Improved diagnostics for incipient faults in analog circuits using LS-SVM based on PSO algorithm with Mahalanobis distance. Neurocomputing 133:237–248CrossRef Long B, Xian W, Li M, Wang H (2014) Improved diagnostics for incipient faults in analog circuits using LS-SVM based on PSO algorithm with Mahalanobis distance. Neurocomputing 133:237–248CrossRef
12.
Zurück zum Zitat Niu G, Singh S, Steven W, Pecht M (2011) Health monitoring of electronic products based on Mahalanobis distance and Weibull decision metrics. Microelectron Reliab 51:279–284CrossRef Niu G, Singh S, Steven W, Pecht M (2011) Health monitoring of electronic products based on Mahalanobis distance and Weibull decision metrics. Microelectron Reliab 51:279–284CrossRef
13.
Zurück zum Zitat Partil N, Menon S, Das D, Pecht M (2010) Anomaly detection of non punch through insulated gate bipolar transistors (IGBT) by robust covariance estimation techniques. Proceedings of Second International Conference on Reliability, Safety & Hazard. doi:10.1109/ICRESH.2010.5779635 Partil N, Menon S, Das D, Pecht M (2010) Anomaly detection of non punch through insulated gate bipolar transistors (IGBT) by robust covariance estimation techniques. Proceedings of Second International Conference on Reliability, Safety & Hazard. doi:10.​1109/​ICRESH.​2010.​5779635
14.
Zurück zum Zitat Pecht M (2008) Prognostics and health management of electronics Wiley-Intersicence, USA Pecht M (2008) Prognostics and health management of electronics Wiley-Intersicence, USA
15.
Zurück zum Zitat Sotiris V, Tse P, Pechit M (2012) Anomaly detection through a Bayesian support vector machine. IEEE Trans Reliab 59(2):277–286CrossRef Sotiris V, Tse P, Pechit M (2012) Anomaly detection through a Bayesian support vector machine. IEEE Trans Reliab 59(2):277–286CrossRef
17.
Zurück zum Zitat Wang S, Chuang F, Xiong F (2008) A novel image thresholding method based on Parzen window estimate. Pattern Recogn 41(1):117–129CrossRefMATH Wang S, Chuang F, Xiong F (2008) A novel image thresholding method based on Parzen window estimate. Pattern Recogn 41(1):117–129CrossRefMATH
18.
Zurück zum Zitat Wang Y, Miao Q, Ma EWM, Tsui KL, Pecht M (2013) Online anomaly detection for hard disk drives based on Mahalanobis distance. IEEE Trans Reliab 62(1):136–145CrossRef Wang Y, Miao Q, Ma EWM, Tsui KL, Pecht M (2013) Online anomaly detection for hard disk drives based on Mahalanobis distance. IEEE Trans Reliab 62(1):136–145CrossRef
19.
Zurück zum Zitat Yuan L, Yigang H, Jiaoying H, Yichuang S (2010) A new neural-network-based fault diagnosis approach for analog circuits by using kurtosis and entropy as a preprocessor. IEEE Trans Instrum Meas 59(3):586–595CrossRef Yuan L, Yigang H, Jiaoying H, Yichuang S (2010) A new neural-network-based fault diagnosis approach for analog circuits by using kurtosis and entropy as a preprocessor. IEEE Trans Instrum Meas 59(3):586–595CrossRef
Metadaten
Titel
Mahalanobis Distance Based Approach for Anomaly Detection of Analog Filters Using Frequency Features and Parzen Window Density Estimation
verfasst von
Zewen Hu
Mingqing Xiao
Lei Zhang
Shuai Liu
Yawei Ge
Publikationsdatum
08.11.2016
Verlag
Springer US
Erschienen in
Journal of Electronic Testing / Ausgabe 6/2016
Print ISSN: 0923-8174
Elektronische ISSN: 1573-0727
DOI
https://doi.org/10.1007/s10836-016-5623-z

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