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Journal of Materials Science: Materials in Electronics
Erschienen in: Journal of Materials Science: Materials in Electronics 8/2019

07.03.2019

Physical properties evaluation of nebulized spray pyrolysis prepared Nd doped ZnO thin films for opto-electronic applications

verfasst von: A. Rohini Devi, A. Jegatha Christy, K. Deva Arun Kumar, S. Valanarasu, Mohamed S. Hamdy, K. S. Al-Namshah, Abdullah M. Alhanash, Dhanasekaran Vikraman, Hyun-Seok Kim

Erschienen in: Journal of Materials Science: Materials in Electronics | Ausgabe 8/2019

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Abstract

Thin films of neodymium (Nd) doped zinc oxide (NZO) were coated onto glass substrates at 400 °C by nebulized spray pyrolysis using different doping weight percentage (wt%) of Nd. The prepared films were exhibited in hexagonal structure of polycrystalline nature along with (002) preferential orientation. Morphological properties and elemental compositions were performed by scanning electron microscopy and energy dispersive by X-ray, respectively. Tauc’s plot discovered the optical energy band gap of 3.17 eV for 5 wt% Nd doped NZO film. PL profiles depicted a solid green emission peak at around 680 nm at room temperature. Optical constants such as refractive indices, dielectric constants, carrier concentration and plasma frequency were evaluated for NZO through optical approximation route. Hall mobility and carrier concentrations were enhanced with rise of Nd doping wt%. A drastic change in the resistivity was observed due to incorporation of Nd dopant and it has evidently demonstrated in detail.
Vorheriger Artikel Effect on reliability and thermal stability of BaxSr2−xSiO4:Eu2+ phosphor film for LED applications
Nächster Artikel Improved adhesion of polyurethane-based coatings to tin surface

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Metadaten
Titel
Physical properties evaluation of nebulized spray pyrolysis prepared Nd doped ZnO thin films for opto-electronic applications
verfasst von
A. Rohini Devi
A. Jegatha Christy
K. Deva Arun Kumar
S. Valanarasu
Mohamed S. Hamdy
K. S. Al-Namshah
Abdullah M. Alhanash
Dhanasekaran Vikraman
Hyun-Seok Kim
Publikationsdatum
07.03.2019
Verlag
Springer US
Erschienen in
Journal of Materials Science: Materials in Electronics / Ausgabe 8/2019
Print ISSN: 0957-4522
Elektronische ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-019-01039-z

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