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Erschienen in: Microsystem Technologies 9-11/2008

01.10.2008 | Technical Paper

Soft X-ray lithography of high aspect ratio SU8 submicron structures

verfasst von: Elena Reznikova, Juergen Mohr, Martin Boerner, Vladimir Nazmov, Peter-Juergen Jakobs

Erschienen in: Microsystem Technologies | Ausgabe 9-11/2008

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Abstract

SU8 submicron structures with an aspect ratio of more than 50 are made by soft X-ray lithography using modified spectra of the synchrotron radiation at the ANKA LITHO-1 beamline, which includes a chromium mirror. The X-ray spectrum is additional shaped by a beam stop and a filter to a narrow band in order to reduce the influence of diffraction and photoelectrons. The exposure determination is based on the measured threshold doses for used SU-8 resist layers as well as on the calculated diffractive distribution of an absorbed power. Post-exposure bake of the resist is performed at low temperature and low pressure to avoid changes of the structural size because of shrinkage due to temperature changes and to eliminate a “skin” layer at the top of the resist. SU8 structures with lateral dimensions of 1 μm and heights from 50 to 80 μm have been fabricated defect free with the optimized process.

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Metadaten
Titel
Soft X-ray lithography of high aspect ratio SU8 submicron structures
verfasst von
Elena Reznikova
Juergen Mohr
Martin Boerner
Vladimir Nazmov
Peter-Juergen Jakobs
Publikationsdatum
01.10.2008
Verlag
Springer-Verlag
Erschienen in
Microsystem Technologies / Ausgabe 9-11/2008
Print ISSN: 0946-7076
Elektronische ISSN: 1432-1858
DOI
https://doi.org/10.1007/s00542-007-0507-x

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