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Journal of Electronic Materials

Ausgabe 1/2014

Special Sections from the 2013 TMS Annual Meeting: Lead-Free Solders; Advanced Materials for Power Electronics and Power Conditioning Systems; and Phase Stability, Phase Transformations, and Reaction Phase Formation in Electronic Materials. Guest Editors: Darrel Frear, Rachael Myers-Ward, Paul Ohodnicki, and Chaohong Wang

Inhalt (37 Artikel)

Mitigation of Sn Whisker Growth by Small Bi Additions

Jung-Lae Jo, Shijo Nagao, Kyoko Hamasaki, Masanobu Tsujimoto, Tohru Sugahara, Katsuaki Suganuma

Effects of POSS-Silanol Addition on Whisker Formation in Sn-Based Pb-Free Electronic Solders

Sihan Liu, Limin Ma, Yutian Shu, K. N. Subramanian, Andre Lee, Fu Guo

Evaluation of Strain Measurement in a Die-to-Interposer Chip Using In Situ Synchrotron X-Ray Diffraction and Finite-Element Analysis

Hsueh-Hsien Hsu, Tz-Cheng Chiu, Tao-Chih Chang, Shin-Yi Huang, Hsin-Yi Lee, Ching-Shun Ku, Yang-Yi Lin, Chien-Hao Su, Li-Wei Chou, Yao-Tsung Ouyang, YI-Ting Huang, Albert T. Wu

Microstructure and Sn Crystal Orientation Evolution in Sn-3.5Ag Lead-Free Solders in High-Temperature Packaging Applications

Bite Zhou, Govindarajan Muralidharan, Kanth Kurumadalli, Chad M. Parish, Scott Leslie, Thomas R. Bieler

Electromigration in Sintered Nanoscale Silver Films at Elevated Temperature

Jesus N. Calata, Guo-Quan Lu, Khai Ngo, Luu Nguyen

Texture and Magnetic Properties of Rolled Fe-6.5 wt.%Si Thin Sheets

Y. C. Yao, Y. H. Sha, J. L. Liu, F. Zhang, L. Zuo

Effect of Mo Addition on Structure and Magnetocaloric Effect in γ-FeNi Nanocrystals

Huseyin Ucar, Mark Craven, D. E. Laughlin, M. E. McHenry

Structure–Property Correlations in CoFe–SiO2 Nanogranular Films Utilizing x-Ray Photoelectron Spectroscopy and Small-Angle Scattering Techniques

P.R. Ohodnicki Jr., V. Sokalski, J. Baltrus, J.B. Kortright, X. Zuo, S. Shen, V. DeGeorge, M.E. McHenry, D.E. Laughlin

Characterization of ALD Beryllium Oxide as a Potential High-k Gate Dielectric for Low-Leakage AlGaN/GaN MOSHEMTs

Derek W. Johnson, Jung Hwan Yum, Todd W. Hudnall, Ryan M. Mushinski, Christopher W. Bielawski, John C. Roberts, Wei-E Wang, Sanjay K. Banerjee, H. Rusty Harris

Interfacial Reactions of High-Bi Alloys on Various Substrates

Jin-Yi Wang, Chih-Ming Chen, Yee-Wen Yen

Nanomeshed Pt(Au) Transparent Contact to p-GaN of Light-Emitting Diode

Xu Feng Li, Cheng-Chieh Chang, Yen-Shuo Liu, Po-Han Chen, Cheng-Yi Liu

SI: Electronic Materials XII

Experimental Studies and Thermodynamic Assessment of Ternary Cu-Pd-Sn Phase Relations Focusing on the Sn-Rich Alloys

Md. Arifur Rahman, Chia-Wei Fan, Shin-Ju Wang, Cheng-En Ho, Wojciech Gierlotka

Interfacial Reactions of Sn, Sn-3.0Ag-0.5Cu, and Sn-9Zn Lead-Free Solders with Fe-42Ni Substrates

Yee-Wen Yen, Yu-Ping Hsieh, Chien-Chung Jao, Chao-Wei Chiu, Yi-Shan Li

Interfacial Reactions in Cu/Ga and Cu/Ga/Cu Couples

Shih-kang Lin, Cheng-liang Cho, Hao-miao Chang

Characteristics of Plasma-Treated Amorphous Ta-Si-C Film as a Diffusion Barrier for Copper Metallization

Jau-Shiung Fang, Wu-Jia Su, Meng-Shuo Huang, Chin-Fu Chiu, Tsung-Shune Chin

Interfacial Reactions Between Columnar or Layered Ni(P) Layers and Sn-Ag-Cu Solder

Y.J. Hu, Y.C. Hsu, C.T. Lu, T.S. Huang, C.Y. Chen, W.N. Chuang, C.Y. Hsiao, C.P. Lin, C.Y. Liu

Polarity Effect in a Sn3Ag0.5Cu/Bismuth Telluride Thermoelectric System

P. Y. Chien, C. H. Yeh, H. H. Hsu, Albert T. Wu

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