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Semiconductors

Ausgabe 6/2018

Inhalt (24 Artikel)

Electronic Properties of Semiconductors

AC Electrical Conductivity of FeIn2Se4 Single Crystals

N. N. Niftiyev, F. M. Mammadov, V. I. Quseynov, S. Sh. Kurbanov

Electronic Properties of Semiconductors

Contribution of Iron Clusters to the Magnetic Properties of Pb1 – yFe y Te Alloys

E. P. Skipetrov, A. A. Solovev, V. E. Slynko

Electronic Properties of Semiconductors

Quasi-Classical Model of the Static Electrical Conductivity of Heavily Doped Degenerate Semiconductors at Low Temperatures

N. A. Poklonski, S. A. Vyrko, A. N. Dzeraviaha

Electronic Properties of Semiconductors

Electrophysical Properties of p-Type Undoped and Arsenic-Doped Hg1 – xCd x Te Epitaxial Layers with x ≈ 0.4 Grown by the MOCVD Method

V. S. Evstigneev, V. S. Varavin, A. V. Chilyasov, V. G. Remesnik, A. N. Moiseev, B. S. Stepanov

Spectroscopy, Interaction with Radiation

Rb1 – xCs x NO3 (x = 0.025, 0.05, 0.1) Single Crystals and Their High-Temperature X-Ray Study

A. F. Haziyeva, V. I. Nasirov, Y. G. Asadov, Y. I. Aliyev, S. H. Jabarov

Spectroscopy, Interaction with Radiation

Forbidden Resonant Raman Scattering in GaAs/AlAs Superlattices: Experiment and Calculations

V. A. Volodin, V. A. Sachkov, M. P. Sinyukov

Surfaces, Interfaces, and Thin Films

Optical Properties of Multilayered Sol–Gel Zinc-Oxide Films

N. M. Denisov, E. B. Chubenko, V. P. Bondarenko, V. E. Borisenko

Semiconductor Structures, Low-Dimensional Systems, and Quantum Phenomena

Study of the Structural and Luminescence Properties of InAs/GaAs Heterostructures with Bi-Doped Potential Barriers

A. S. Pashchenko, L. S. Lunin, S. N. Chebotarev, M. L. Lunina

Semiconductor Structures, Low-Dimensional Systems, and Quantum Phenomena

X-Ray Diffraction Analysis of Features of the Crystal Structure of GaN/Al0.32Ga0.68N HEMT-Heterostructures by the Williamson–Hall Method

S. S. Pushkarev, M. M. Grekhov, N. V. Zenchenko

Semiconductor Structures, Low-Dimensional Systems, and Quantum Phenomena

Quantum Oscillations of Photoconductivity Relaxation in p–i–n GaAs/InAs/AlAs Heterodiodes

Yu. N. Khanin, E. E. Vdovin

Semiconductor Structures, Low-Dimensional Systems, and Quantum Phenomena

Heterostructures of Single-Wavelength and Dual-Wavelength Quantum-Cascade Lasers

A. V. Babichev, A. S. Kurochkin, E. C. Kolodeznyi, A. V. Filimonov, A. A. Usikova, V. N. Nevedomsky, A. G. Gladyshev, L. Ya. Karachinsky, I. I. Novikov, A. Yu. Egorov

Semiconductor Structures, Low-Dimensional Systems, and Quantum Phenomena

Study of the Properties of II–VI and III–V Semiconductor Quantum Dots

A. I. Mikhailov, V. F. Kabanov, I. A. Gorbachev, E. G. Glukhovsky

Microcrystalline, Nanocrystalline, Porous, and Composite Semiconductors

Properties of Lead-Sulfide Nanoparticles in a Multicrystalline Structure

N. D. Zhukov, A. G. Rokakh, M. I. Shishkin

Carbon Systems

On the Possibility of the Propagation of Solitary Electromagnetic Waves in Bigraphene

E. I. Kukhar, S. V. Kryuchkov, E. S. Ionkina

Physics of Semiconductor Devices

High-Sensitivity Photodetector Based on Atomically Thin MoS2

S. D. Lavrov, A. P. Shestakova, E. D. Mishina, Yu. R. Efimenkov, A. S. Sigov

Physics of Semiconductor Devices

Tunneling Current in Oppositely Connected Schottky Diodes Formed by Contacts between Degenerate n-GaN and a Metal

I. O. Maiboroda, J. V. Grishchenko, I. S. Ezubchenko, I. S. Sokolov, I. A. Chernych, A. A. Andreev, M. L. Zanaveskin

Physics of Semiconductor Devices

Model for Charge Accumulation in n- and p-MOS Transistors during Tunneling Electron Injection from a Gate

O. V. Aleksandrov, S. A. Mokrushina

Fabrication, Treatment, and Testing of Materials and Structures

Effect of the Sapphire-Nitridation Level and Nucleation-Layer Enrichment with Aluminum on the Structural Properties of AlN Layers

T. V. Malin, D. S. Milakhin, V. G. Mansurov, Yu. G. Galitsyn, A. S. Kozhuhov, V. V. Ratnikov, A. N. Smirnov, V. Yu. Davydov, K. S. Zhuravlev

Fabrication, Treatment, and Testing of Materials and Structures

Effect of Pulsed Gamma-Neutron Irradiation on the Photosensitivity of Si-Based Photodiodes with GeSi Nanoislands and Ge Epitaxial Layers

M. M. Ivanova, A. N. Kachemtsev, A. N. Mikhaylov, D. O. Filatov, A. P. Gorshkov, N. S. Volkova, V. Yu. Chalkov, V. G. Shengurov

Fabrication, Treatment, and Testing of Materials and Structures

Effect of Chemical Treatment of a Silicon Surface on the Quality and Structure of Silicon-Carbide Epitaxial Films Synthesized by Atom Substitution

I. P. Kalinkin, S. A. Kukushkin, A. V. Osipov

Fabrication, Treatment, and Testing of Materials and Structures

Laser-Induced Modification of the Surface of Ge2Sb2Te5 Thin Films: Phase Changes and Periodic-Structure Formation

S. A. Yakovlev, A. V. Ankudinov, Yu. V. Vorobyov, M. M. Voronov, S. A. Kozyukhin, B. T. Melekh, A. B. Pevtsov

Fabrication, Treatment, and Testing of Materials and Structures

Variation in the Conductivity of Polyaniline Nanotubes During Their Formation

V. M. Kapralova, I. Yu. Sapurina, N. T. Sudar’

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