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Journal of Materials Science: Materials in Electronics
Erschienen in: Journal of Materials Science: Materials in Electronics 18/2020

05.08.2020

Structural, electrical and radiation shielding properties of polyvinyl alcohol doped with different nanoparticles

verfasst von: M. Rashad, T. A. Hanafy, Shams A. M. Issa

Erschienen in: Journal of Materials Science: Materials in Electronics | Ausgabe 18/2020

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Abstract

Both pure and doped polyvinyl alcohol (PVA) with 1 wt% of Ni, NiO and Fe2O3 nanoparticles (NPs) were prepared using the casting method. The structural and electrical properties of the composite were extensively studied. Moreover, the radiation shielding of these composites was studied. XRD results prove the semi-crystalline structure of pure PVA because of crystalline and amorphous phases are appeared. The electrical conductivity (σdc) and current–voltage (I–V) characterization for all PVA samples have been an investigation. The separation (R) and energy of hopping (W) were calculated. Also, the temperature dependence of the conductivity for all pure samples was investigated using Mott’s variable-range hopping model. The obtained results suggest strongly the applicability of these samples in the electronic applications. Furthermore, radiation shielding parameters have been calculated. Results show that PVA with 1% Ni sample has the highest values of mass attenuation coefficient, effective atomic number, fast neutrons removal cross-sections and absorption neutron scattering cross-section among other samples.
Vorheriger Artikel Improvement of microwave dielectric properties of Ba2Ti9O20 ceramics using [Zn1/3Nb2/3]4+ substitution for Ti4+
Nächster Artikel Binder-free high-performance Fe3O4 fine particles in situ grown onto N-doped porous graphene layers co-embedded into porous substrate as supercapacitor electrode

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Metadaten
Titel
Structural, electrical and radiation shielding properties of polyvinyl alcohol doped with different nanoparticles
verfasst von
M. Rashad
T. A. Hanafy
Shams A. M. Issa
Publikationsdatum
05.08.2020
Verlag
Springer US
Erschienen in
Journal of Materials Science: Materials in Electronics / Ausgabe 18/2020
Print ISSN: 0957-4522
Elektronische ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-020-04083-2

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