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Erschienen in: Journal of Electronic Testing 1/2018

01.03.2018

Vulnerability Analysis of Adder Architectures Considering Design and Synthesis Constraints

verfasst von: Mostafa Salehi, Ali Azarpeyvand, Armin Hajaboutalebi Aboutalebi

Erschienen in: Journal of Electronic Testing | Ausgabe 1/2018

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Abstract

Advances in VLSI technology have made circuits more vulnerable to faults. Architectural vulnerability factor (AVF) reflects the possibility that a transient fault eventually causes an error in the circuit output. This factor represents the system vulnerability to transient faults and is used to compare different fault-tolerant designs or architectures. In this paper, we have introduced a simulation-based fault injection framework which is developed to evaluate the AVF of different adder hardware description models in various abstraction levels. Then, we introduce the most beneficial abstraction level for evaluating the vulnerability of a design. Finally, exploiting our fault injection framework, we compare the inherent fault tolerance of eight famous adders. We have explored the design space of different adder architectures while considering both delay and area constraints for comparing the inherent fault tolerance level of different adder architectures. To the best of our knowledge, this comparative study is not covered in the literature elsewhere.

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Metadaten
Titel
Vulnerability Analysis of Adder Architectures Considering Design and Synthesis Constraints
verfasst von
Mostafa Salehi
Ali Azarpeyvand
Armin Hajaboutalebi Aboutalebi
Publikationsdatum
01.03.2018
Verlag
Springer US
Erschienen in
Journal of Electronic Testing / Ausgabe 1/2018
Print ISSN: 0923-8174
Elektronische ISSN: 1573-0727
DOI
https://doi.org/10.1007/s10836-017-5701-x

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