Skip to main content
Erschienen in: Microsystem Technologies 2/2008

01.02.2008 | Technical Paper

Analytical investigation and numerical verification of Casimir effect on electrostatic nano-cantilevers

verfasst von: Asghar Ramezani, Aria Alasty, Javad Akbari

Erschienen in: Microsystem Technologies | Ausgabe 2/2008

Einloggen

Aktivieren Sie unsere intelligente Suche, um passende Fachinhalte oder Patente zu finden.

search-config
loading …

Abstract

In this paper, the two-point boundary value problem (BVP) of the nano-cantilever deflection subjected to Casimir and electrostatic forces is investigated using analytical and numerical methods to obtain the instability point of the nano-beam. In the analytical treatment of the BVP, the nonlinear differential equation of the model is transformed into the integral form by using the Green’s function of the cantilever beam. Then, closed-form solutions are obtained by assuming an appropriate shape function for the beam deflection to evaluate the integrals. The pull-in parameters of the beam are computed under the combined effects of electrostatic and Casimir forces. Electrostatic microactuators and freestanding nanoactuators are considered as special cases of our study. The detachment length and the minimum initial gap of freestanding nanocantilevers, which are the basic design parameters for NEMS switches, are determined. The results of the analytical study are verified by numerical solution of the BVP. The centerline of the beam under the effect of electrostatic and Casimir forces at small deflections and at the point of instability is obtained numerically to test the validity of the shape function assumed for the beam deflection in the analytical investigation. Finally, the large deformation theory is applied in numerical simulations to study the effect of the finite kinematics on the pull-in parameters of nano-canilevers.

Sie haben noch keine Lizenz? Dann Informieren Sie sich jetzt über unsere Produkte:

Springer Professional "Wirtschaft+Technik"

Online-Abonnement

Mit Springer Professional "Wirtschaft+Technik" erhalten Sie Zugriff auf:

  • über 102.000 Bücher
  • über 537 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Maschinenbau + Werkstoffe
  • Versicherung + Risiko

Jetzt Wissensvorsprung sichern!

Springer Professional "Technik"

Online-Abonnement

Mit Springer Professional "Technik" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 390 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Maschinenbau + Werkstoffe




 

Jetzt Wissensvorsprung sichern!

Anhänge
Nur mit Berechtigung zugänglich
Literatur
Zurück zum Zitat Bernstein D, Guidotti P, Pelesko JA (2000) Mathematical analysis of an electrostatically actuated MEMS device. In: Proceedings of Modeling and Simulation of Microsystems (MSM), pp 489–492 Bernstein D, Guidotti P, Pelesko JA (2000) Mathematical analysis of an electrostatically actuated MEMS device. In: Proceedings of Modeling and Simulation of Microsystems (MSM), pp 489–492
Zurück zum Zitat Bochobza-Degani O, Nemirovsky Y (2002) Modeling the pull-in parameters of electrostatic actuators with a novel lumped two degrees of freedom pull-in model. Sens Actuators A 97–98:569–578CrossRef Bochobza-Degani O, Nemirovsky Y (2002) Modeling the pull-in parameters of electrostatic actuators with a novel lumped two degrees of freedom pull-in model. Sens Actuators A 97–98:569–578CrossRef
Zurück zum Zitat Cheng J, Zhe J, Wu X (2004) Analytical and finite element model pull-in study of rigid and deformable electrostatic microactuators. J Micromech Microeng 14:57–68CrossRef Cheng J, Zhe J, Wu X (2004) Analytical and finite element model pull-in study of rigid and deformable electrostatic microactuators. J Micromech Microeng 14:57–68CrossRef
Zurück zum Zitat Ding JN, Wen SZ, Meng YG (2001) Theoretical study of the sticking of a membrane strip in MEMS under the Casimir effect. J Micromech Microeng 11:202–208CrossRef Ding JN, Wen SZ, Meng YG (2001) Theoretical study of the sticking of a membrane strip in MEMS under the Casimir effect. J Micromech Microeng 11:202–208CrossRef
Zurück zum Zitat Gupta RK (1997) Electrostatic pull-in test structure design for in-situ mechanical property measurements of microelectromechanical systems. Ph.D. Thesis, MIT, Cambridge, MA Gupta RK (1997) Electrostatic pull-in test structure design for in-situ mechanical property measurements of microelectromechanical systems. Ph.D. Thesis, MIT, Cambridge, MA
Zurück zum Zitat Haung JM, Liew KM, Wong CH, Rajendran S, Tan MJ, Liu AQ (2001) Mechanical design and optimization of capacitive micromachined switch. Sens Actuators A 1993:273–285CrossRef Haung JM, Liew KM, Wong CH, Rajendran S, Tan MJ, Liu AQ (2001) Mechanical design and optimization of capacitive micromachined switch. Sens Actuators A 1993:273–285CrossRef
Zurück zum Zitat Israelachvili JN (1992) Intermolecular and surface forces. Academic, London Israelachvili JN (1992) Intermolecular and surface forces. Academic, London
Zurück zum Zitat Johnstone RW, Parameswaran M (2002) Theoretical limits on the freestanding length of cantilevers produced by surface micromachining technology. J Micromech Microeng 12:855–861CrossRef Johnstone RW, Parameswaran M (2002) Theoretical limits on the freestanding length of cantilevers produced by surface micromachining technology. J Micromech Microeng 12:855–861CrossRef
Zurück zum Zitat Ke CH, Espinosa HD, Pugno N (2005a) Numerical analysis of nanotube based NEMS devices—part II: Role of finite kinematics, stretching and charge concentrations. J Appl Mech 72:726–731MATHCrossRef Ke CH, Espinosa HD, Pugno N (2005a) Numerical analysis of nanotube based NEMS devices—part II: Role of finite kinematics, stretching and charge concentrations. J Appl Mech 72:726–731MATHCrossRef
Zurück zum Zitat Ke CH, Pugno N, Peng B, Espinosa HD (2005b) Experiments and modeling of carbon nanotube-based NEMS devices. J Mech Phys Solids 53:1314–1333CrossRef Ke CH, Pugno N, Peng B, Espinosa HD (2005b) Experiments and modeling of carbon nanotube-based NEMS devices. J Mech Phys Solids 53:1314–1333CrossRef
Zurück zum Zitat Kim P, Lieber CM (1999) Nanotube nanotweezers. Science 286:2148–2150CrossRef Kim P, Lieber CM (1999) Nanotube nanotweezers. Science 286:2148–2150CrossRef
Zurück zum Zitat Lamoreaux SK (2005) The Casimir force: background, experiments, and applications. Rep Prog Phys 68:201–236CrossRef Lamoreaux SK (2005) The Casimir force: background, experiments, and applications. Rep Prog Phys 68:201–236CrossRef
Zurück zum Zitat Lin WH, Zhao YP (2003) Dynamic behavior of nanoscale electrostatic actuators. Chin Phys Lett 20:2070–2073CrossRef Lin WH, Zhao YP (2003) Dynamic behavior of nanoscale electrostatic actuators. Chin Phys Lett 20:2070–2073CrossRef
Zurück zum Zitat Lin WH, Zhao YP (2005a) Casimir effect on the pull-in parameters of nanometer switches. Microsyst Thechnol 11:80–85 Lin WH, Zhao YP (2005a) Casimir effect on the pull-in parameters of nanometer switches. Microsyst Thechnol 11:80–85
Zurück zum Zitat Lin WH, Zhao YP (2005b) Nonlinear behavior for nanoscale electrostatic actuators with Casimir force. Chaos Solitons Fractals 23:1777–1785MATHCrossRef Lin WH, Zhao YP (2005b) Nonlinear behavior for nanoscale electrostatic actuators with Casimir force. Chaos Solitons Fractals 23:1777–1785MATHCrossRef
Zurück zum Zitat Mostepanenko VM, Trunov NN (1997) The Casimir effect and its application. Oxford Science, New York Mostepanenko VM, Trunov NN (1997) The Casimir effect and its application. Oxford Science, New York
Zurück zum Zitat Osterberg PM, Senturia SD (1997) M-TEST: a test chip for MEMS material property measurement using electrostatically actuated test structures. J Microelectromech Syst 6(2):107–118CrossRef Osterberg PM, Senturia SD (1997) M-TEST: a test chip for MEMS material property measurement using electrostatically actuated test structures. J Microelectromech Syst 6(2):107–118CrossRef
Zurück zum Zitat Pelesko JA (2001) Multiple solutions in electrostatic MEMS. In: Proceedings of modeling and simulation of microsystems (MSM), pp 290–293 Pelesko JA (2001) Multiple solutions in electrostatic MEMS. In: Proceedings of modeling and simulation of microsystems (MSM), pp 290–293
Zurück zum Zitat Pelesko JA, Bernstein DH (2003) Modeling MEMS and NEMS. Chapman & Hall/CRC, London Pelesko JA, Bernstein DH (2003) Modeling MEMS and NEMS. Chapman & Hall/CRC, London
Zurück zum Zitat Petersen KE (1978) Dynamic micromechanics on silicon: techniques and devices. IEEE Trans Electron Devices ED-25(10):1241–1250 Petersen KE (1978) Dynamic micromechanics on silicon: techniques and devices. IEEE Trans Electron Devices ED-25(10):1241–1250
Zurück zum Zitat Ramezani A, Alasty A, Akbari J (2006) Influence of van der Waals force on the pull-in parameters of cantilever type nanoscale electrostatic actuators. J Microsyst Technol 12(12):1153–1161CrossRef Ramezani A, Alasty A, Akbari J (2006) Influence of van der Waals force on the pull-in parameters of cantilever type nanoscale electrostatic actuators. J Microsyst Technol 12(12):1153–1161CrossRef
Zurück zum Zitat Serry M, Walliser D, Maclay J (1995) The anharmonic Casimir oscillator. J Microelectromech Syst 4:193–205CrossRef Serry M, Walliser D, Maclay J (1995) The anharmonic Casimir oscillator. J Microelectromech Syst 4:193–205CrossRef
Zurück zum Zitat Timoshenko S (1987) Theory of plates and shells. McGraw Hill, New York Timoshenko S (1987) Theory of plates and shells. McGraw Hill, New York
Metadaten
Titel
Analytical investigation and numerical verification of Casimir effect on electrostatic nano-cantilevers
verfasst von
Asghar Ramezani
Aria Alasty
Javad Akbari
Publikationsdatum
01.02.2008
Verlag
Springer-Verlag
Erschienen in
Microsystem Technologies / Ausgabe 2/2008
Print ISSN: 0946-7076
Elektronische ISSN: 1432-1858
DOI
https://doi.org/10.1007/s00542-007-0409-y

Weitere Artikel der Ausgabe 2/2008

Microsystem Technologies 2/2008 Zur Ausgabe

Neuer Inhalt