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Journal of Electronic Testing

Erschienen in:

01.08.2013

Correlation of Heavy-Ion and Laser Testing on a DC/DC PWM Controller

verfasst von: Y. Ren, S.-T. Shi, L. Chen, H.-B. Wang, L.-J. Gao, G. Guo, S.-J. Wen, R. Wong, N. W. van Vonno

Erschienen in: Journal of Electronic Testing | Ausgabe 4/2013

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Abstract

Pulsed laser and heavy-ion experiments were carried out on a commercial-off-the-shelf DC/DC pulse width modulation controller to study the equivalent laser Linear Energy Transfer (LET) at wavelengths of 750 nm, 800 nm, 850 nm and 920 nm. The laser experiments showed that the shorter wavelength laser has smaller threshold energy to generate single-event transient pulses. The cross-sections versus heavy-ion LET and laser energy per pulse were obtained and correlated. The heavy-ion and laser cross-sections fit well considering the effects of metal layers on the chip. The results of this research facilitate the future pulsed laser testing by providing explicit coefficients to evaluate the equivalent laser LET, which can be used to replace costly heavy-ion testing.

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Adell PC, Schrimpf RD, Choi BK, Holman WT, Attwood JP, Cirba CR, Galloway KF (2002) Total-dose and single-event effects in switching DC/DC power converters. IEEE Trans Nucl Sci 49(6):3217–3221CrossRef

Buchner S, McMorrow D, Poivey C, Howard J Jr, Boulghassoul Y, Massengill LW, Pease R, Savage RM (2004) Comparison of single-event transients induced in an operational amplifier (LM124) by pulsed laser light and a broad beam of heavy ions. IEEE Trans Nucl Sci 51(5):2776–2781CrossRef

Buchner S, McMorrow D, Sternberg A, Massengill L, Pease RL, Maher M (2002) Single-event transient (SET) characterization of an LM119 voltage comparator: an approach to SET model validation using a pulsed laser. IEEE Trans Nucl Sci 49(3):1502–1508CrossRef

Buchner S, Warner J, McMorrow D, Miller F, Morand S, Pouget V, Larue C, Adell P, Allen G (2011) “Comparison of single event transients generated at four pulsed-laser test facilities - NRL, IMS, EADS, JPL,” Radiation and Its Effects on Components and Systems (RADECS), pp. 430–433

Darracq F, Lapuyade H, Buard N, Mounsi F, Foucher B, Fouillat P, Calvet MC, Dufayel R (2002) Backside SEU laser testing for commercial off-the-shelf SRAMs. IEEE Trans Nucl Sci 49:2977–2983CrossRef

Guo G, Shen D, Shi S, Chen Q, Liu J, Xu J, Lu X, Hui N, Cai L, Gao L, Wang H, Teng R, Wu B, Wang D, Du S, Fan H (2011) “Irradiation facility and technique to increase LET for SEE testing on tandem accelerator,” Radiation and Its Effects on Components and Systems (RADECS), pp. 724–728

Label K, Barry RK, Castell K, Kim HS, Seidleck CM (1995) Implications of single event effect characterization of hybrid dc/dc converters and a solid state power controller. IEEE Trans Nucl Sci 38:1957–1963CrossRef

LaLumondiere SD, Koga R, Yu P, Maher MC, Moss SC (2002) Laser-induced and heavy ion-induced single-event transient (SET) sensitivity measurements on 139-type comparators. IEEE Trans Nucl Sci 49(6):3121–3128CrossRef

Mazer JA, Buchner S, Kang K (1989) Laser simulation of single-event upset in a p-well CMOS counter. IEEE Trans Nucl Sci 36(1):1330–1332CrossRef

10.

McMorrow D, Melinger JS, Haddad NF (2000) Application of a pulsed laser for evaluation and optimization of SEU-hard designs. IEEE Trans Nucl Sci 47(3):559–565CrossRef

11.

Moss SC, LaLumondiere SD, Scarpulla JR, MacWilliams KP, Koga R (1995) Correlation of picosecond laser-induced latchup and energetic particle-induced latchup in CMOS test structures. IEEE Trans Nucl Sci 42(6):1948–1956CrossRef

12.

Penzin SH, Crain WR, Crawford KB, Hansel SJ, Koga R (1997) “The SEU in pulse width modulation controllers with soft start and shutdown circuits,” Proc. IEEE Radiation Effects Data Workshop, pp. 73–79

13.

Penzin SH, Crain WR, Craword KB, Hansel SJ, Kirshman JF, Koga R (1996) Single event effects in pulse width modulation controllers. IEEE Trans Nucl Sci 43(6):2968–2973CrossRef

14.

Petersen (2008) “Soft error results analysis and error rate prediction,” IEEE NSREC Short Course

15.

Pouget V, Lapuyade H, Fouillat P, Lewis D, Buchner S (2001) “Theoretical investigation of an equivalent laser LET,” Microelectronics Reliability, pp. 1513–1518

16.

Ren Y, Fan L, Chen L, Wen S-J, Wong R, van Vonno NW, Witulski AF, Bhuva BL (2012) Single-event effects analysis of a pulse width modulator IC in a DC/DC converter. Springer Journal of Electronic Testing Theory and Applications JETTA 28(6):877–883CrossRef

17.

Schwank JR, Shaneyfelt MR, McMorrow D, Ferlet-Cavrois V, Dodd PE, Heidel DF, Marshall PW, Pellish JA, LaBel KA, Rodbell KP, Hakey M, Flores RS, Swanson SE, Dalton SM (2010) Estimation of heavy ion LET thresholds in advanced SOI IC technologies from two-photon absorption laser measurements. IEEE Trans Nucl Sci 57:1827–1834CrossRef

18.

van Vonno NW, Pearce LG, Gill JS, Satterfield HW, Thomson ET, Fobes TE, Williams AP, Chesley PJ (2010) “Total dose and single event testing of a hardened point of load regulator,” Radiation Effects Data Workshop (REDW), IEEE

19.

van Vonno NW, Pearce LG, Wood GM, White JD, Thomson EJ, Bernard TM, Chesley PJ, Hood R (2010) “Total dose and single event testing of a hardened single-ended current mode PWM controller,” Radiation Effects Data Workshop (REDW), IEEE

20.

Weulersse, Bezerra F, Miller F, Carriere T, Buard N, Falo W (2007) “Probing SET sensitive volumes in linear devices using focused laser beam at different wavelengths,” RADECS Conference

Titel: Correlation of Heavy-Ion and Laser Testing on a DC/DC PWM Controller
verfasst von: Y. Ren
S.-T. Shi
L. Chen
H.-B. Wang
L.-J. Gao
G. Guo
S.-J. Wen
R. Wong
N. W. van Vonno
Publikationsdatum: 01.08.2013
Verlag: Springer US
Erschienen in: Journal of Electronic Testing / Ausgabe 4/2013
Print ISSN: 0923-8174
Elektronische ISSN: 1573-0727
DOI: https://doi.org/10.1007/s10836-013-5379-7

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