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Erschienen in:
01.09.2010
Investigation of rare earth-doped BiAg high-temperature solders
Erschienen in: Journal of Materials Science: Materials in Electronics | Ausgabe 9/2010
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Abstract
In the present work, the microstructure and properties of the rare earth Ce-doped BiAg solders with various Ag content are investigated. The results indicate that the maximum of the shear strength appears in the BiAg solder joints containing 5 and 7.5 wt.% Ag. At the same time, a similar trend appears in the hardness test of the BiAg bulk solders. Moreover, the results show that the microstructure and properties of the solders can be modified due to the unique properties of rare earth element. Small amounts of rare earth addition may enhance the wettability of SiAg solder on Cu substrate, and result in the increase of the shear strength of the solder joints. However, the rare earth addition may not give obvious influence on the melting temperature and the electrical conductivity. Thus, it is expected that the BiAg solder containing small amounts of rare earth element may possess a better potential as a replacement for high-Pb solders.