Microstructural and surface morphological studies on Co doped ZnS diluted magnetic semiconductor thin films

Microstructural and surface morphological studies of Co (2.5%) doped ZnS thin films deposited at different substrate temperatures (T_S) of 200, 400 and 600 °C by means of pulsed laser deposition are presented. The deposited films are in wurtzite-hexagonal crystal structure as confirmed by X-ray diffraction and Raman spectroscopy techniques. The films deposited at higher T_S show columnar morphology, as evidence by transmission electron microscopy measurements. Images of the surface topography have been taken by atomic force microscopy (AFM) for the film deposited at different T_S. The film deposited at T_S of 200 °C shows cone-like structures while deposited at T_S of 400 and 600 °C show columnar structures. A fractal analysis has been performed on AFM images to understand the microstructure and surface morphology of thin film at different T_S. Fractal analysis also reveals the morphological changes in the film with increasing T_S. The observed ferromagnetism is correlated with columnar growth of the film which can be used as diluted magnetic semiconductor for spintronic applications.