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Journal of Electronic Testing
Erschienen in: Journal of Electronic Testing 1/2020

28.01.2020

Optimal Selection of Tests for Fault Diagnosis in Multi-Path System with Time-delay

verfasst von: Zhexi Yao, Lingchao Zhu, Tao Zhang, Jinbo Wang

Erschienen in: Journal of Electronic Testing | Ausgabe 1/2020

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Abstract

Test selection is an important process to simplify the system structure and build a diagnostic system. Test selection problem in a multi-path system with time delay is investigated in this paper. The fault detection rate (FDR) and fault isolation rate (FIR) of the multi-path system are introduced. A heuristic function is then established to evaluate the uncertainty of the test, which can provide heuristic information to improve searching efficiency of the algorithm. An improved heuristic SSO algorithm GSSO is proposed to solve the test selection problem. The grey system theory is introduced into GSSO to improve the effect of optimization. The GSSO is compared with DPSO and SSO algorithms, and shows that the characteristics of jumping out of the local optimal solution earlier and faster convergence speed.
Vorheriger Artikel Modeling Remapping Based Fault Tolerance Techniques for Chip Multiprocessor Cache with Design Space Exploration
Nächster Artikel High-Level Implementation-Independent Functional Software-Based Self-Test for RISC Processors

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Metadaten
Titel
Optimal Selection of Tests for Fault Diagnosis in Multi-Path System with Time-delay
verfasst von
Zhexi Yao
Lingchao Zhu
Tao Zhang
Jinbo Wang
Publikationsdatum
28.01.2020
Verlag
Springer US
Erschienen in
Journal of Electronic Testing / Ausgabe 1/2020
Print ISSN: 0923-8174
Elektronische ISSN: 1573-0727
DOI
https://doi.org/10.1007/s10836-020-05854-9

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