Ausgabe 1/2020
Inhalt (14 Artikel)
Reliability Model and Sensitivity Analysis for General Electronic Systems with Failure Types based on Non-identical Correlated Components
Seyed Mostafa Banitaba, Roya M. Ahari, Mahdi Karbasian
Trojan Detection Test for Clockless Circuits
Ricardo Aquino Guazzelli, Matheus Garay Trindade, Leonel Acunha Guimarães, Thiago Ferreira de Paiva Leite, Laurent Fesquet, Rodrigo Possamai Bastos
On Using Approximate Computing to Build an Error Detection Scheme for Arithmetic Circuits
B. Deveautour, A. Virazel, P. Girard, V. Gherman
Multi-Threaded Mitigation of Radiation-Induced Soft Errors in Bare-Metal Embedded Systems
Alejandro Serrano-Cases, Felipe Restrepo-Calle, Sergio Cuenca-Asensi, Antonio Martínez-Álvarez
Modeling Remapping Based Fault Tolerance Techniques for Chip Multiprocessor Cache with Design Space Exploration
Avishek Choudhury, Biplab K. Sikdar
Optimal Selection of Tests for Fault Diagnosis in Multi-Path System with Time-delay
Zhexi Yao, Lingchao Zhu, Tao Zhang, Jinbo Wang
High-Level Implementation-Independent Functional Software-Based Self-Test for RISC Processors
Adeboye Stephen Oyeniran, Raimund Ubar, Maksim Jenihhin, Jaan Raik
An Efficient Test Set Construction Scheme for Multiple Missing-Gate Faults in Reversible Circuits
Mousum Handique, Jantindra Kumar Deka, Santosh Biswas
Improved Pseudo-Random Fault Coverage Through Inversions: a Study on Test Point Architectures
Soham Roy, Brandon Stiene, Spencer K. Millican, Vishwani D. Agrawal
Manuscript
An Efficient Accuracy Reconfigurable CLA Adder Designs Using Complementary Logic
Sujit Kumar Patel, Bharat Garg, Shireesh Kumar Rai