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Erschienen in: Journal of Materials Science: Materials in Electronics 13/2021

17.06.2021

A study on the electrical and dielectric properties of SrGdxFe12−xO19 (x = 0.00–0.05) nanosized M-type hexagonal ferrites

verfasst von: B. Ünal, M. A. Almessiere, Y. Slimani, A. Demir Korkmaz, A. Baykal

Erschienen in: Journal of Materials Science: Materials in Electronics | Ausgabe 13/2021

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Abstract

Single-phase SrGdxFe12−xO19 (x = 0.00–0.05) nanosized M-type hexagonal ferrites (NHFs) were prepared via citrate sol–gel route. The formation of Gd substituted Sr-hexaferrites has been confirmed by XRD, SEM, TEM and EDX for all substitutions. The X-ray powder patterns revealed the hexagonal crystal structure of all products. The electrical and dielectric properties of SrGdxFe12−xO19 NHFs were investigated extensively with an impedance spectroscopy up to 3.0 MHz from 20 to 120 °C. Both electrical and dielectric components including ac/dc conductivity, dielectric constant, dielectric loss and lossy tangent were evaluated for measurement temperatures up to 120 °C. It has been indicated that ac conductivity generally complies with power law rules, mainly dependent on Gd3+-ion substitution ratios. The impedance analysis showed that due to the influence of various Gd3+-ion substitution ratios in the NHFs, the conduction mechanisms can mainly be attributed to the grain-grain boundaries. The dielectric constant of SrGdxFe12−xO19 NHFs owns a normal dielectric distribution with the frequency, largely due to varying substitution ratios. In other words, the variation of Gd3+-ion substitution can be used to modify the conduction mechanism of NHFs. Therefore, the observed change in dielectric properties as a function of frequency can be clarified on a phenomenological basis by Koop’s model of the electrical conduction mechanism in most composite ferrites.

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Metadaten
Titel
A study on the electrical and dielectric properties of SrGdxFe12−xO19 (x = 0.00–0.05) nanosized M-type hexagonal ferrites
verfasst von
B. Ünal
M. A. Almessiere
Y. Slimani
A. Demir Korkmaz
A. Baykal
Publikationsdatum
17.06.2021
Verlag
Springer US
Erschienen in
Journal of Materials Science: Materials in Electronics / Ausgabe 13/2021
Print ISSN: 0957-4522
Elektronische ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-021-06373-9

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