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Erschienen in: Journal of Materials Science: Materials in Electronics 4/2019

02.01.2019

Fabrication of high-temperature-resistant bondline based on multilayer core–shell hybrid microspheres for power devices

verfasst von: Fuwen Yu, Hongtao Chen, Chunjin Hang, Mingyu Li

Erschienen in: Journal of Materials Science: Materials in Electronics | Ausgabe 4/2019

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Abstract

This paper presents a fabrication method for high-temperature-resistant bondlines based on Cu@Ag@Sn multilayer core–shell hybrid microspheres in which a Ag layer was adopted to accelerate the consumption of a Sn layer. The phase transformation and microstructural evolution during the bonding process were investigated in detail. After the microspheres were heated at 250 °C for 20 min under a pressure of 0.5 MPa, the bondline could withstand high operation temperatures of up to 480 °C. After reflowing at 250 °C for just 5 min, the outer low-melting-point Sn layer was completely consumed. After 20 min, the bondline was composed of Ag3Sn and Cu3Sn intermetallic compounds with a dispersion of Cu microspheres. The average shear strengths of the resulting bondlines were 39.9 and 31.9 MPa at room temperature and at 400 °C, respectively.

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Metadaten
Titel
Fabrication of high-temperature-resistant bondline based on multilayer core–shell hybrid microspheres for power devices
verfasst von
Fuwen Yu
Hongtao Chen
Chunjin Hang
Mingyu Li
Publikationsdatum
02.01.2019
Verlag
Springer US
Erschienen in
Journal of Materials Science: Materials in Electronics / Ausgabe 4/2019
Print ISSN: 0957-4522
Elektronische ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-018-00637-7

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