Skip to main content
Erschienen in: Journal of Computational Electronics 2/2018

05.02.2018

FDTD algorithm to achieve absolute stability in performance analysis of SWCNT interconnects

verfasst von: C. Venkataiah, K. Satyaprasad, T. Jayachandra Prasad

Erschienen in: Journal of Computational Electronics | Ausgabe 2/2018

Einloggen

Aktivieren Sie unsere intelligente Suche, um passende Fachinhalte oder Patente zu finden.

search-config
loading …

Abstract

Crosstalk analysis in very-large-scale (VLSI) interconnects is usually carried out using finite-difference time-domain (FDTD) methods. However, the stability of FDTD is limited by the Courant–Friedrichs–Lewy (CFL) stability criteria. In this work, we propose an innovative FDTD algorithm to overcome the stability limitations due to the CFL criteria and make the analysis absolutely stable for all times. Using the proposed FDTD method, we analyze the response of coupled interconnects for symmetric and asymmetric inputs with both in-phase and out-of-phase switching. We further analyzed the functional switching and determined how to reduce noise peaks due to crosstalk. For all responses, we compared our new algorithm with HSPICE results, revealing greatly enhanced accuracy and central processing unit (CPU) runtime compared with conventional FDTD. Finally, relative and absolute stability analyses of the proposed FDTD method were carried out using Nyquist and Routh–Hurwitz (R–H) criteria.

Sie haben noch keine Lizenz? Dann Informieren Sie sich jetzt über unsere Produkte:

Springer Professional "Wirtschaft+Technik"

Online-Abonnement

Mit Springer Professional "Wirtschaft+Technik" erhalten Sie Zugriff auf:

  • über 102.000 Bücher
  • über 537 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Maschinenbau + Werkstoffe
  • Versicherung + Risiko

Jetzt Wissensvorsprung sichern!

Springer Professional "Technik"

Online-Abonnement

Mit Springer Professional "Technik" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 390 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Maschinenbau + Werkstoffe




 

Jetzt Wissensvorsprung sichern!

Springer Professional "Wirtschaft"

Online-Abonnement

Mit Springer Professional "Wirtschaft" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 340 Zeitschriften

aus folgenden Fachgebieten:

  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Versicherung + Risiko




Jetzt Wissensvorsprung sichern!

Literatur
1.
Zurück zum Zitat Burke, P.J.: Luttinger liquid theory as a model of the gigahertz electrical properties of carbon nanotubes. IEEE Trans. Nanotechnol. 1(5), 129–144 (2002)CrossRef Burke, P.J.: Luttinger liquid theory as a model of the gigahertz electrical properties of carbon nanotubes. IEEE Trans. Nanotechnol. 1(5), 129–144 (2002)CrossRef
2.
Zurück zum Zitat Dresselhaus, M.S., Dresselhaus, G., Avouris, P.: Topics in Applied Physics, Carbon Nanotubes: Synthesis, Structure, Properties and Applications. Springer, Berlin (2000)MATH Dresselhaus, M.S., Dresselhaus, G., Avouris, P.: Topics in Applied Physics, Carbon Nanotubes: Synthesis, Structure, Properties and Applications. Springer, Berlin (2000)MATH
3.
Zurück zum Zitat Li, H., Yin, W.Y., Banerjee, K., Mao, J.F.: Circuit modeling and performance analysis of multi-walled carbon nanotube interconnects. IEEE Trans. Electron Devices 55(6), 1328–1337 (2008)CrossRef Li, H., Yin, W.Y., Banerjee, K., Mao, J.F.: Circuit modeling and performance analysis of multi-walled carbon nanotube interconnects. IEEE Trans. Electron Devices 55(6), 1328–1337 (2008)CrossRef
4.
Zurück zum Zitat Liang, F., Wang, G., Lin, H.: Modeling of crosstalk effects in multiwall carbon nanotube interconnects. IEEE Trans. Electromagn. Compat. 54(1), 133–139 (2012)CrossRef Liang, F., Wang, G., Lin, H.: Modeling of crosstalk effects in multiwall carbon nanotube interconnects. IEEE Trans. Electromagn. Compat. 54(1), 133–139 (2012)CrossRef
5.
Zurück zum Zitat Li, X., Mao, J., Swaminathan, M.: Transient analysis of CMOS-gate driven RLGC interconnects based on FDTD. IEEE Trans. CAD Integr. Circuits Syst. 30(4), 574–583 (2011)CrossRef Li, X., Mao, J., Swaminathan, M.: Transient analysis of CMOS-gate driven RLGC interconnects based on FDTD. IEEE Trans. CAD Integr. Circuits Syst. 30(4), 574–583 (2011)CrossRef
6.
Zurück zum Zitat Kumar, V.R., Kaushik, B.K., Patnaik, A.: Improved crosstalk noise modeling of MWCNT interconnects using FDTD technique. Microelectr. J. 46(12), 1263–1268 (2015)CrossRef Kumar, V.R., Kaushik, B.K., Patnaik, A.: Improved crosstalk noise modeling of MWCNT interconnects using FDTD technique. Microelectr. J. 46(12), 1263–1268 (2015)CrossRef
7.
Zurück zum Zitat Orlandi, A., Paul, C.R.: FDTD analysis of lossy, multiconductor transmission lines terminated in arbitrary loads. IEEE Trans. Electromagn. Compat. 38(3), 388–399 (1996)CrossRef Orlandi, A., Paul, C.R.: FDTD analysis of lossy, multiconductor transmission lines terminated in arbitrary loads. IEEE Trans. Electromagn. Compat. 38(3), 388–399 (1996)CrossRef
8.
Zurück zum Zitat Namiki, T.: A new FDTD algorithm based on alternating-direction implicit method. IEEE Trans. Microw. Theory Tech. 47(10), 2003–2007 (1999)CrossRef Namiki, T.: A new FDTD algorithm based on alternating-direction implicit method. IEEE Trans. Microw. Theory Tech. 47(10), 2003–2007 (1999)CrossRef
9.
Zurück zum Zitat Kumar, V.R., Kaushik, B.K., Patnaik, A.: An unconditionally stable FDTD model for crosstalk analysis of VLSI interconnects. IEEE Trans. Compon. Packag. Manuf. Technol. 5(12), 1810–1817 (2015)CrossRef Kumar, V.R., Kaushik, B.K., Patnaik, A.: An unconditionally stable FDTD model for crosstalk analysis of VLSI interconnects. IEEE Trans. Compon. Packag. Manuf. Technol. 5(12), 1810–1817 (2015)CrossRef
10.
Zurück zum Zitat Nishad, A.K., Sharma, R.: Performance improvement in SC-MLGNRs interconnects using interlayer dielectric insertion. IEEE Trans. Emerg. Top. Comput. 3(4), 470–482 (2015)CrossRef Nishad, A.K., Sharma, R.: Performance improvement in SC-MLGNRs interconnects using interlayer dielectric insertion. IEEE Trans. Emerg. Top. Comput. 3(4), 470–482 (2015)CrossRef
11.
Zurück zum Zitat Ahmed, I., Chua, E.K., Li, E.P., Chen, Z.: Development of the three-dimensional unconditionally stable LOD-FDTD method. IEEE Trans. Antennas Propag. 56(11), 3596–3600 (2008)MathSciNetCrossRefMATH Ahmed, I., Chua, E.K., Li, E.P., Chen, Z.: Development of the three-dimensional unconditionally stable LOD-FDTD method. IEEE Trans. Antennas Propag. 56(11), 3596–3600 (2008)MathSciNetCrossRefMATH
12.
Zurück zum Zitat Sun, C., Trueman, C.W.: Unconditionally stable Crank-Nicolson scheme for solving two-dimensional Maxwell’s equations. Electron. Lett. 39(7), 595–597 (2003)CrossRef Sun, C., Trueman, C.W.: Unconditionally stable Crank-Nicolson scheme for solving two-dimensional Maxwell’s equations. Electron. Lett. 39(7), 595–597 (2003)CrossRef
13.
Zurück zum Zitat Afrooz, K.: Time domain analysis of field effect transistors using unconditionally stable finite difference method. IET Sci. Measur. Technol. 10(7), 686–692 (2016)CrossRef Afrooz, K.: Time domain analysis of field effect transistors using unconditionally stable finite difference method. IET Sci. Measur. Technol. 10(7), 686–692 (2016)CrossRef
14.
Zurück zum Zitat Kumar, V.R., Majumder, M.K., Alam, A., Kukkam, N.R., Kaushik, B.K.: Stability and delay analysis of multi-layered GNR and multi-walled CNT Interconnects. J. Comput. Electron. 14(2), 611–618 (2015)CrossRef Kumar, V.R., Majumder, M.K., Alam, A., Kukkam, N.R., Kaushik, B.K.: Stability and delay analysis of multi-layered GNR and multi-walled CNT Interconnects. J. Comput. Electron. 14(2), 611–618 (2015)CrossRef
16.
Zurück zum Zitat Rai, M.K., Kaushik, B.K., Sarkar, S.: Thermally aware performance analysis of single-walled carbon nanotube bundle as VLSI interconnects. J. Comput. Electron. 15(2), 407 (2016)CrossRef Rai, M.K., Kaushik, B.K., Sarkar, S.: Thermally aware performance analysis of single-walled carbon nanotube bundle as VLSI interconnects. J. Comput. Electron. 15(2), 407 (2016)CrossRef
17.
Zurück zum Zitat Das, D., Rahaman, H.: Analysis of crosstalk in single- and multiwall carbon nanotube interconnects and its impact on gate oxide reliability. IEEE Trans. Nanotechnol. 10(6), 1362–1370 (2011)CrossRef Das, D., Rahaman, H.: Analysis of crosstalk in single- and multiwall carbon nanotube interconnects and its impact on gate oxide reliability. IEEE Trans. Nanotechnol. 10(6), 1362–1370 (2011)CrossRef
18.
Zurück zum Zitat Burke, P.J.: An RF circuit model for carbon nanotubes. IEEE Trans. Nanotechnol. 2(1), 55–58 (2003)CrossRef Burke, P.J.: An RF circuit model for carbon nanotubes. IEEE Trans. Nanotechnol. 2(1), 55–58 (2003)CrossRef
19.
Zurück zum Zitat Naeemi, A., Meindl, J.D.: Design and performance modeling for single-walled carbon nanotubes as local, semiglobal, and global interconnects in gig scale integrated systems. IEEE Trans. Electron Devices 54(1), 26–37 (2007)CrossRef Naeemi, A., Meindl, J.D.: Design and performance modeling for single-walled carbon nanotubes as local, semiglobal, and global interconnects in gig scale integrated systems. IEEE Trans. Electron Devices 54(1), 26–37 (2007)CrossRef
20.
Zurück zum Zitat Kim, W., Javey, A., Tu, R., Cao, J., Wang, Q., Dai, H.: Electrical contacts to carbon nanotubes down to 1 nm in diameter. Appl. Phys. Lett. 87, 173101-1–173101-3 (2005) Kim, W., Javey, A., Tu, R., Cao, J., Wang, Q., Dai, H.: Electrical contacts to carbon nanotubes down to 1 nm in diameter. Appl. Phys. Lett. 87, 173101-1–173101-3 (2005)
21.
Zurück zum Zitat Srivastava, A., Xu, Y., Sharma, A.K.: Carbon nanotubes for next generation very large scale integration interconnects. J. Nanophoton. 4(1), 1–26 (2010)CrossRef Srivastava, A., Xu, Y., Sharma, A.K.: Carbon nanotubes for next generation very large scale integration interconnects. J. Nanophoton. 4(1), 1–26 (2010)CrossRef
22.
Zurück zum Zitat Kantartzis, N.V., Tsiboukis, T.D.: Modern EMC Analysis Techniques: Time-Domain Computational Schemes, vol. 1, 1st edn, pp. 1–224. Morgan & Claypool, San Rafael (2008) Kantartzis, N.V., Tsiboukis, T.D.: Modern EMC Analysis Techniques: Time-Domain Computational Schemes, vol. 1, 1st edn, pp. 1–224. Morgan & Claypool, San Rafael (2008)
23.
Zurück zum Zitat Corradini, L., Maksimovic, D., Mattavelli, P., Zane, R.: Digital Control in Digital Control of High-Frequency Switched-Mode Power Converters, vol. 1, pp. 360–370. Wiley-IEEE Press, New York (2015) Corradini, L., Maksimovic, D., Mattavelli, P., Zane, R.: Digital Control in Digital Control of High-Frequency Switched-Mode Power Converters, vol. 1, pp. 360–370. Wiley-IEEE Press, New York (2015)
Metadaten
Titel
FDTD algorithm to achieve absolute stability in performance analysis of SWCNT interconnects
verfasst von
C. Venkataiah
K. Satyaprasad
T. Jayachandra Prasad
Publikationsdatum
05.02.2018
Verlag
Springer US
Erschienen in
Journal of Computational Electronics / Ausgabe 2/2018
Print ISSN: 1569-8025
Elektronische ISSN: 1572-8137
DOI
https://doi.org/10.1007/s10825-017-1125-1

Weitere Artikel der Ausgabe 2/2018

Journal of Computational Electronics 2/2018 Zur Ausgabe

Neuer Inhalt