Journal of Electronic Testing

Editorial

Vishwani D. Agrawal

Test Technology Newsletter

Critical Path Selection for Delay Testing Considering Coupling Noise

Rajeshwary Tayade, Jacob A. Abraham

Fault Detection Structures of the S-boxes and the Inverse S-boxes for the Advanced Encryption Standard

Mehran Mozaffari-Kermani, Arash Reyhani-Masoleh

X-tolerant Test Data Compaction with Accelerated Shift Registers

Martin Hilscher, Michael Braun, Michael Richter, Andreas Leininger, Michael Gössel

Adaptive Debug and Diagnosis Without Fault Dictionaries

Stefan Holst, Hans-Joachim Wunderlich

A Reliable Architecture for Parallel Implementations of the Advanced Encryption Standard

G. Di Natale, M. Doulcier, M. L. Flottes, B. Rouzeyre

A Modified Charge Pumping Method for Measuring Interface States Up to the Ghz Range

R. Fernández