Ausgabe 2/2001
Inhalt (13 Artikel)
Detectability Conditions of Full Opens in the Interconnections
Antonio Zenteno, Victor H. Champac, Joan Figueras
An Effective Deterministic BIST Scheme for Shifter/Accumulator Pairs in Datapaths
Nektarios Kranitis, Antonis Paschalis, Dimitris Gizopoulos, Mihalis Psarakis, Yervant Zorian
Fault Models and Test Generation for OpAmp Circuits—The FFM
José Vicente Calvano, Antônio Carneiro de Mesquita Filho, Vladimir Castro Alves, Marcelo Soares Lubaszewski
A Low-Cost BIST Architecture for Linear Histogram Testing of ADCs
F. Azaïs, S. Bernard, Y. Bertrand, M. Renovell
Synthesis of an 8051-Like Micro-Controller Tolerant to Transient Faults
Érika Cota, Fernanda Lima, Sana Rezgui, Luigi Carro, Raoul Velazco, Marcelo Lubaszewski, Ricardo Reis
Improving Reconfigurable Systems Reliability by Combining Periodical Test and Redundancy Techniques: A Case Study
Eduardo Augusto Bezerra, Fabian Vargas, Michael Paul Gough
Constraint Based Criteria: An Approach for Test Case Selection in the Structural Testing
Silvia Regina Vergilio, José Carlos Maldonado, Mario Jino
An Isochronous Testing Strategy for Hierarchical Adaptive Distributed System-Level Diagnosis
Alessandro Brawerman, Elias Procópio Duarte Jr.
Call for Papers